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You searched on: Author: martin green

Displaying records 21 to 30 of 32 records.
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21. High Contrast Scanning Nano-Raman Spectroscopy of Silicon
Published: 6/15/2007
Authors: N Lee, R Hartschuh, D Mehtani, A Kisliuk, M D Foster, Alexei Sokolov, J F Maguire, Martin L Green
Abstract: We have demonstrated that scanning nano-Raman spectroscopy (SNRS), generally known as tip enhanced Raman spectroscopy (TERS), with side illumination optics can be effectively used for analysis of silicon based structures at the nanoscale. Even though ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851022

22. High Contrast Scanning Nano-Raman Spectroscopy of Silicon
Published: 6/1/2007
Authors: N Lee, R Hartschuh, D Mehtani, A Kisliuk, M D Foster, Alexei Sokolov, J F Maguire, Martin L Green
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854366

23. The Use of Apertures to Create Discrete Combinatorial Libraries Using Pulsed Laser Deposition
Published: 5/18/2007
Authors: Nabil Bassim, Peter K. Schenck, Eugene Donev, Edwin J Heilweil, Eric J Cockayne, Martin L Green, Leonard Feldman
Abstract: In Pulsed-Laser Deposition (PLD), there are many processing parameters that influence film properties which may be studied such as substrate-target distance, background reactive gas pressure, laser energy, substrate temperature and composition in mul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851029

24. A High-Throughput Thermoelectric Power-Factor Screening Tool for Rapid Construction of Thermoelectric Property Diagrams
Published: 1/23/2007
Authors: Makoto Otani, Nathan Lowhorn, Peter K. Schenck, Winnie K Wong-Ng, Martin L Green, K Itaka, H Koinuma
Abstract: We have developed a high throughput screening tool that maps out thermoelectric power factors of combinatorial composition-spread film libraries. The screening tool allows us to measure the electrical conductivity and Seebeck coefficient of over 1000 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851068

25. Design and Spectroscopic Reflectometry Characterization of Pulsed Laser Deposition Combinatorial Libraries
Published: 1/22/2007
Authors: Peter K. Schenck, Nabil Bassim, Makoto Otani, Hiroyuki Oguchi, Martin L Green
Abstract: The goal of the design of pulsed laser deposition (PLD) combinatorial library films is to optimize the compositional coverage of the films while maintaining a uniform thickness. The deposition pattern of excimer laser PLD films can be modeled with a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851017

26. Combinatorial Study of Ni-Ti-Pt Ternary Metal Gate Electrodes on HfO2 for the Advanced Gate Stack
Published: 10/2/2006
Authors: K S Chang, Martin L Green, John S Suehle, Eckhard Vogel, Hao Xiong, Jason Hattrick-Simpers, Ichiro Takeuchi, O Famodu, K Ohmori, P Ahmet, T Chikyow, Prashant Majhi, B -H Lee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854309

27. Combinatorial Study of Ni-Ti-Pt Ternary Metal Gate Electrodes on HfO^d2^ for the Advanced Gate Stack
Published: 10/2/2006
Authors: Kao-Shuo Chang, Martin L Green, John S Suehle, Eric M. Vogel, Hao Xiong, Jason Hattrick-Simpers, Ichiro Takeuchi, O Famodu, K Ohnaka, T Chikyow, Prashant Majhi, B H Lee, M Gardner
Abstract: We have fabricated combinatorial Ni-Ti-Pt ternary metal gate thin film libraries on HfO2 using magnetron co-sputtering, to investigate flat-band voltage shift (DVfb) and leakage current density (JL) variations. Wavelength dispersive spectroscopy (WDS ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850953

28. A Combinatorial Study of Metal Gate/HfO2 MOSCAPS
Published: 9/1/2006
Authors: Martin L Green, K S Chang, Ichiro Takeuchi, T Chikyow
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854327

29. The Nucleation of Atomic Layer Deposited HfO2 Films, and Evolution of Their Microstruture, Studied by Grazing Incidence Small Angle X-ray Scattering Using Synchrotron Radiation
Published: 1/16/2006
Authors: Martin L Green, Andrew John Allen, Xiang Li, Junling Wang, J Ilavsky, A Delabie, R Puurunen, B Brijs
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854304

30. Strain Relaxation in Patterned Strained Silicon Directly on Insulator Structures
Published: 12/19/2005
Authors: R Z Lei, W Tsai, I Aberg, T B O'Reilly, J L Hoyt, D A Antoniadis, H I Smith, Albert J. Paul, Martin L Green, J Li, R Hull
Abstract: Strain relaxation is studied in Strained Silicon Directly on Insulator (SSDOI) substrates patterned with nano-scale features. Using interference lithography, biaxially-strained SSDOI substrates with 30 nm-thick strained Si on insulator films were pa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850913



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