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You searched on: Author: john gillen

Displaying records 41 to 50 of 86 records.
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41. Automated Analysis of Organic Particles Using Cluster SIMS
Published: 6/1/2004
Authors: John G Gillen, Cynthia J Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A Fletcher, P Chi, Jennifer R Verkouteren, David S. Bright, R Lareau, M Boldman
Abstract: Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ...

42. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry
Published: 6/1/2004
Authors: Christine M. Mahoney, S V. Roberson, John G Gillen
Abstract: The feasibility of cluster Secondary Ion Mass Spectrometry (SIMS) for depth profiling of drug delivery systems is explored. Behaviors of various biodegradable polymer films under dynamic SF^d5^^u+^ primary ion bombardment was investigated including s ...

43. Dynamic SIMS Utilizing SF^d5^^u+^ Polyatomic Primary Ion Beams for Drug Delivery Applications
Published: 6/1/2004
Authors: Christine M. Mahoney, S V. Roberson, John G Gillen
Abstract: The behavior of various biodegradable polymer films (e.g. polylactic acid, polyglycolic acid and polycaprolactone) as well as some model drugs (theophylline and 4-acetamidophenol) under dynamic SF^d5^^u+^ primary ion bombardment is explored. A serie ...

44. Positive Secondary Ion Yield Enhancement of Metal Elements Using Trichlorotrifluoroethane and Tetrachloroethene Backfilling
Published: 6/1/2004
Authors: P Chi, John G Gillen
Abstract: Positive secondary ion yields are strongly enhanced by the presence of reactive gas species. Oxygen primary ion bombardment or oxygen backfilling is commonly used for this purpose. However, for some weak oxide forming metal elements such as Nb, Mo, ...

45. Bevel Depth Profiling SIMS for Analysis of Layer Structures
Published: 9/1/2003
Authors: John G Gillen, Scott A Wight, P Chi, Albert J. Fahey, Jennifer R Verkouteren, Eric S Windsor, D. B. Fenner
Abstract: We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or ce ...

46. Thermolithographic Patterning of Sol-Gel Metal Oxides on Micro hot plate Sensing Arrays Using Organosilanes
Published: 9/1/2003
Authors: N O. Savage, S V. Roberson, John G Gillen, Michael J Tarlov, Stephen Semancik
Abstract: Sol-gel derived SnO2 and Fe2O3 were selectively deposited on elements of microhotplate (?HP) arrays. The silicon micromachined ?HP arrays contain heating elements (100 ?m x 100 ?m) that are electronically addressable and thermally isolated from each ...

47. Raman Microspectroscopy of some High Explosives heated to High Temperatures
Published: 8/1/2003
Authors: E S. Etz, S V. Roberson, John G Gillen
Abstract: Paper reports on the micro-Raman spectra of several high explosives heated to high temperatures, up to melting point. These spectroscopic results are correlated with the degradation and decomposition of these energetic materials.

48. Tools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry
Published: 7/1/2003
Authors: John G Gillen, David S. Bright
Abstract: In this work we demonstrate the use of secondary ion mass spectrometry (SIMS) combined with the Lispix image processing program (Bright 1995) to generate quantitative isotope ratio images from a test sample of a calcium-aluminum rich inclusion (CA ...

49. Secondary Ion Mass Spectrometry Using Cluster Primary Ion Beams
Published: 1/1/2003
Authors: John G Gillen, Albert J. Fahey
Abstract: At the National Institute of Standards and Technology (NIST) we have a capability for conducting cluster SIMS experiments on both our ion microscope and TOF-SIMS instruments. This paper will review our recent work on cluster ion source development, ...

50. Copper Oxide Precipitates in NBS Standard Reference Material 482
Series: Journal of Research (NIST JRES)
Published: 12/1/2002
Authors: Eric S Windsor, R Carlton, John G Gillen, Scott A Wight, David S. Bright
Abstract: Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on ...

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