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Author: john gillen

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41. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry
Published: 6/1/2004
Authors: Christine M. Mahoney, S V. Roberson, John G Gillen
Abstract: The feasibility of cluster Secondary Ion Mass Spectrometry (SIMS) for depth profiling of drug delivery systems is explored. Behaviors of various biodegradable polymer films under dynamic SF^d5^^u+^ primary ion bombardment was investigated including s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831329

42. Dynamic SIMS Utilizing SF^d5^^u+^ Polyatomic Primary Ion Beams for Drug Delivery Applications
Published: 6/1/2004
Authors: Christine M. Mahoney, S V. Roberson, John G Gillen
Abstract: The behavior of various biodegradable polymer films (e.g. polylactic acid, polyglycolic acid and polycaprolactone) as well as some model drugs (theophylline and 4-acetamidophenol) under dynamic SF^d5^^u+^ primary ion bombardment is explored. A serie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831312

43. Positive Secondary Ion Yield Enhancement of Metal Elements Using Trichlorotrifluoroethane and Tetrachloroethene Backfilling
Published: 6/1/2004
Authors: P Chi, John G Gillen
Abstract: Positive secondary ion yields are strongly enhanced by the presence of reactive gas species. Oxygen primary ion bombardment or oxygen backfilling is commonly used for this purpose. However, for some weak oxide forming metal elements such as Nb, Mo, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831326

44. Bevel Depth Profiling SIMS for Analysis of Layer Structures
Published: 9/1/2003
Authors: John G Gillen, Scott A Wight, P Chi, Albert J. Fahey, Jennifer R Verkouteren, Eric S Windsor, D. B. Fenner
Abstract: We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or ce ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831302

45. Thermolithographic Patterning of Sol-Gel Metal Oxides on Micro hot plate Sensing Arrays Using Organosilanes
Published: 9/1/2003
Authors: N O. Savage, S V. Roberson, John G Gillen, Michael J Tarlov, Stephen Semancik
Abstract: Sol-gel derived SnO2 and Fe2O3 were selectively deposited on elements of microhotplate (?HP) arrays. The silicon micromachined ?HP arrays contain heating elements (100 ?m x 100 ?m) that are electronically addressable and thermally isolated from each ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830796

46. Raman Microspectroscopy of some High Explosives heated to High Temperatures
Published: 8/1/2003
Authors: E S. Etz, S V. Roberson, John G Gillen
Abstract: Paper reports on the micro-Raman spectra of several high explosives heated to high temperatures, up to melting point. These spectroscopic results are correlated with the degradation and decomposition of these energetic materials.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831289

47. Tools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry
Published: 7/1/2003
Authors: John G Gillen, David S. Bright
Abstract: In this work we demonstrate the use of secondary ion mass spectrometry (SIMS) combined with the Lispix image processing program (Bright 1995) to generate quantitative isotope ratio images from a test sample of a calcium-aluminum rich inclusion (CA ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831237

48. Secondary Ion Mass Spectrometry Using Cluster Primary Ion Beams
Published: 1/1/2003
Authors: John G Gillen, Albert J. Fahey
Abstract: At the National Institute of Standards and Technology (NIST) we have a capability for conducting cluster SIMS experiments on both our ion microscope and TOF-SIMS instruments. This paper will review our recent work on cluster ion source development, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831247

49. Copper Oxide Precipitates in NBS Standard Reference Material 482
Series: Journal of Research (NIST JRES)
Published: 12/1/2002
Authors: Eric S Windsor, R Carlton, John G Gillen, Scott A Wight, David S. Bright
Abstract: Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831277

50. Sol-Gel Materials for Gas Phase Sensing Using Microhotplate Arrays
Published: 2/1/2002
Authors: N O Savage, Richard E Cavicchi, Michael J Tarlov, Stephen Semancik, John G Gillen
Abstract: Sol-gel chemistry is used to create suspensions (sols) of small particles of materials such as metal oxides. These suspensions can be dried to a gel or powder or used in the sol form for coatings and thin films. One promising application of sol-gel d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831252



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