NIST logo

Publications Portal

You searched on:
Author: thomas germer
Sorted by: title

Displaying records 1 to 10 of 159 records.
Resort by: Date / Title

1. A Goniometric Optical Scatter Instrument for Bidirectional Reflectance Distribution Function Measurements with Out-of-plane and Polarimetry Capabilities, ed. by Z.H. Gu and A.A. Maradudin
Published: 1/1/1997
Authors: Thomas Avery Germer, Clara C. Asmail

2. A Novel Hemispherical Spectro-Polarimetric Scattering Instrument for Skin Lesion Imaging
Published: Date unknown
Authors: Bruno Boulbry, Thomas Avery Germer, J C Ramella-Roman
Abstract: We present a novel spectro-polarimetric instrument based on hemispherical backscattering for the assessment of superficial skin lesions. The system is capable of capturing polarized light images non-invasively. The effect of the rough skin backscatte ...

3. A Spectroscopic Polarimeter For Detecting Chiral Signatures In Astrobiological Samples
Published: 9/11/2009
Authors: Baoliang Wang, William Sparks, Thomas Avery Germer, Andy Leadbetter
Abstract: We have developed a polarimeter for accurately measuring both the circular and linear polarization components of a light beam from 400 nm to 800 nm. This polarimeter is designed to work at low light levels that are typical in astronomical application ...

4. A Traceable Scatterometry Measurement of a Silicon Line Grating
Published: 5/26/2011
Authors: Thomas Avery Germer, Heather J Patrick, Ronald G Dixson
Abstract: In this paper, we present a spectroscopic Mueller matrix ellipsometry measurement of a silicon line grating with nominal pitch of 600 nm and line width 100 nm. An uncertainty analysis is performed on the measurement results. The results are compare ...

5. A compact and robust method for full Stokes spectropolarimetry
Published: 8/1/2012
Authors: William Sparks, Thomas Avery Germer, John MacKenty, Frans Snik
Abstract: We present an approach to spectropolarimetry which requires neither moving parts nor time dependent modulation, and which o ers the prospect of achieving high sensitivity. The concept, which is one of those generically known as channeled polarimetry, ...

6. A novel hemispherical spectro-polarimetric scattering instrument for skin lesion imaging, ed. by N. Kollias
Published: 1/1/2006
Authors: Bruno Boulbry, Thomas Avery Germer, J C Ramella-Roman

7. Angular Dependence and Polarization of Out-of-plane Optical Scattering from Particulate Contamination, Subsurface Defects, and Surface Microroughness
Published: 1/1/1997
Author: Thomas Avery Germer

8. Angular Distribution of Light Scattered From a Sinusoidal Grating
Published: 1/1/2000
Authors: Egon Marx, Thomas Avery Germer, Theodore Vincent Vorburger, B C. Park
Abstract: The angular distributions of light scattered by gold-coated and aluminum-coated gratings having amplitudes of ~90 nm and periods of 6.67 ¿m were measured and calculated for light incident from a HeNe laser at an angle of 6E. Experimental results are ...

9. Angular Distribution of Light Scattered from a Sinusoidal Grating
Published: 1/1/2000
Authors: E Marx, Thomas Avery Germer, T V Vorburger, B C Park

10. Anisotropic, Hierarchical Surface Patterns via Surface Wrinkling of Nanoimprinted Polymer Films
Published: 10/22/2012
Authors: Junghyun Lee, Hyun W. Ro, Rui Huang, Thomas Avery Germer, Paul Lemaillet, Christopher Soles, Christopher M Stafford
Abstract: we demonstrated the wrinkling behavior of nanopatterned PS films, whose wrinkle wavelength and resultant morphology depend strongly on geometric parameters of surface patterns as well as the direction of the applied strain relative to the nanopattern ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series