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Author: thomas germer

Displaying records 11 to 20 of 164 records.
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11. Anisotropic, Hierarchical Surface Patterns via Surface Wrinkling of Nanoimprinted Polymer Films
Published: 10/22/2012
Authors: Junghyun Lee, Hyun W. Ro, Rui Huang, Thomas Avery Germer, Paul Lemaillet, Christopher L Soles, Christopher M Stafford
Abstract: we demonstrated the wrinkling behavior of nanopatterned PS films, whose wrinkle wavelength and resultant morphology depend strongly on geometric parameters of surface patterns as well as the direction of the applied strain relative to the nanopattern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912044

12. Tunable Supercontinuum Fiber Laser Source for BRDF Measurements in the STARR II Gonioreflectometer
Published: 9/27/2012
Authors: Heather J Patrick, Clarence Joseph Zarobila, Thomas Avery Germer, Victor Alan Ying, Catherine C Cooksey, Benjamin K Tsai
Abstract: STARR II is a planned NIST facility for spectral measurements of specular reflectance and diffuse bidirectional reflectance distribution function (BRDF) that is the follow-on to the current NIST STARR (Spectral Tri-function Automated Reference Reflec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912019

13. Upper roughness limitations on the TIS/RMS relationship
Published: 9/27/2012
Authors: J C Stover, Sven Schroeder, Thomas Avery Germer
Abstract: The relationship between total integrated scatter (TIS) and root mean square (rms) roughness was developed in the radar literature and enabled the first use of scatter measurements to monitor optical roughness. This relationship has been used and mi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911799

14. A compact and robust method for full Stokes spectropolarimetry
Published: 8/1/2012
Authors: William Sparks, Thomas Avery Germer, John MacKenty, Frans Snik
Abstract: We present an approach to spectropolarimetry which requires neither moving parts nor time dependent modulation, and which o ers the prospect of achieving high sensitivity. The concept, which is one of those generically known as channeled polarimetry, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911231

15. Out-of-plane Stokes imaging polarimeter for early skin cancer diagnosis
Published: 7/1/2012
Authors: P. Ghassemi, Paul Lemaillet, Thomas Avery Germer, J. W. Shupp, S. Venna, M. E. Boisvert, K. E. Flanagan, M. H. Jordan, J. C. Ramella-Roman
Abstract: Optimal treatment of skin cancer before it metastasizes depends critically on early diagnosis and treatment. Imaging spectroscopy and polarized remittance have been utilized in the past for diagnostic purposes, but valuable information can be also o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910098

16. BRDF measurements of graphite used in high-temperature fixed point blackbody radiators: a multi-angle study at 405 nm and 658 nm
Published: 3/12/2012
Authors: Heather J Patrick, Leonard M Hanssen, Jinan Zeng, Thomas Avery Germer
Abstract: We have measured angle- and polarization-resolved, hemispherical bidirectional reflectance distribution function (BRDF) for two types of graphite used in the fabrication of high temperature fixed point (HTFP) blackbody cavities. Measurements were m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909520

17. Differential matrices for depolarizing media
Published: 3/1/2012
Author: Thomas Avery Germer
Abstract: The evolution of a Stokes vector through depolarizing media is considered. A general form for the differential matrix is derived that is appropriate in the presence of depolarization, and is parameterized in a manner that ensures that it yields, upon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909647

18. A Traceable Scatterometry Measurement of a Silicon Line Grating
Published: 5/26/2011
Authors: Thomas Avery Germer, Heather J Patrick, Ronald G Dixson
Abstract: In this paper, we present a spectroscopic Mueller matrix ellipsometry measurement of a silicon line grating with nominal pitch of 600 nm and line width 100 nm. An uncertainty analysis is performed on the measurement results. The results are compare ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908506

19. Effects of Roughness on Scatterometry Signatures
Published: 5/26/2011
Authors: Martin Foldyna, Thomas Avery Germer, Brent Bergner
Abstract: We used azimuthally-resolved spectroscopic Mueller matrix ellipsometry to study a periodic silicon line structure with and without artificially-generated line edge roughness (LER). Grating profiles were determined from multiple azimuthal configuratio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908805

20. Mueller matrix bidirectional reflectance distribution function measurements and modeling of diffuse reflectance standards
Published: 4/20/2011
Authors: Thomas Avery Germer, Heather J Patrick
Abstract: We measure the Mueller matrix bidirectional reflectance distribution function (BRDF) of pressed and sintered powdered polytetrafluoroethylene (PTFE) reflectance standards for an incident angle of 75°. Rotationally averaged Mueller matrices from the m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909321



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