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Author: jon geist

Displaying records 61 to 70 of 83 records.
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61. Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications. Part I: Simulation Programs
Series: Journal of Research (NIST JRES)
Published: 8/30/1991
Authors: Jon C Geist, Deane Chandler-Horowitz, A. M. Robinson, C. James
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12864

62. Testing the Accuracy of Calculated Equilibrium Carrier Concentrations in the Presence of Surface Fields
Published: 7/1/1991
Authors: Jon C Geist, J R. Lowney, C. James, A. M. Robinson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6944

63. Generalized Photodiode Self-Calibration Formula
Published: 3/1/1991
Authors: R. Kohler, Jon C Geist, J. Bonhoure
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11727

64. Micromachined Thermal Radiation Emitter from a Commercial CMOS Process
Published: 2/1/1991
Authors: M. Parameswaran, A. M. Robinson, David L. Blackburn, Michael Gaitan, Jon C Geist
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24752

65. Planar Silicon Photosensors: An Overview
Published: 12/31/1990
Authors: Jon C Geist, A. R. Schaefer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10201

66. Low-Contrast Thermal Resolution Test Targets: A New Approach
Series: Journal of Research (NIST JRES)
Published: 12/30/1990
Authors: Jon C Geist, Donald B. Novotny
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19206

67. An Accurate Value for the Absorption Coefficient of Silicon at 633 nm
Series: Journal of Research (NIST JRES)
Published: 10/30/1990
Authors: Jon C Geist, A. R. Schaefer, J-F. Song, Y. H. Wang, E. F. Zalewski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6062

68. Shape of the Silicon Absorption Coefficient Spectrum Near 1.63 eV
Published: 8/20/1990
Authors: Jon C Geist, A. Migdall, H. P. Baltes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=26383

69. Reflectometer for Measurements of Scattering from Photodiodes and Other Low Scattering Surfaces
Published: 7/20/1990
Authors: R. Kohler, J. E. Luther, Jon C Geist
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13157

70. Surface-Field Induced Feature in the Quantum Yield of Silicon Near 3.5 eV
Published: 7/15/1990
Authors: Jon C Geist, J. L. Gardner, F. J. Wilkinson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27339



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