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You searched on: Author: roy geiss

Displaying records 31 to 40 of 50 records.
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31. Strain-Induced Grain Growth during Rapid Thermal Cycling of Aluminum Interconnects
Published: 1/1/2007
Authors: Robert R Keller, Roy H. Geiss, Nicholas Barbosa, Andrew J Slifka, David Thomas Read
Abstract: We demonstrate by use of automated electron backscatter diffraction (EBSD) the rapid growth of grains in non-passivated, sputtered Al-1Si interconnects during 200 Hz thermal cycling induced by alternating electric current. Mean grain diameters were o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50338

32. COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS AS DETERMINED BY XRD AND EBSD
Published: 10/2/2006
Authors: Jens Mueller, Davor Balzar, Roy H. Geiss, David Thomas Read, Robert R Keller
Abstract: Texture in materials has a large influence on many properties of thin films; it is customarily determined by neutron or X-ray diffraction by measuring pole figures and evaluating orientation-distribution functions (ODF). X-ray diffraction (XRD) was t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50205

33. Anisotropic elastic properties of nanocrystalline nickel thin films
Published: 5/1/2006
Authors: Donna C. Hurley, Roy H. Geiss, N Jennett, Malgorzata Kopycinska-Mueller, A Maxwell, Jens Mueller, David Thomas Read, J Wright
Abstract: As length scales continue to shrink, new tools are needed to measure mechanical properties. We are developing two such tools using different nondestructive acoustical techniques. Surface acoustic wave spectroscopy (SAWS) uses laser-ultrasonic methods ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50050

34. Size-related plasticity effects in AFM silicon cantilever tips
Published: 4/17/2006
Authors: Malgorzata Kopycinska-Mueller, Roy H. Geiss, Donna C. Hurley
Abstract: We are developing dynamic atomic force microscopy (AFM) techniques to determine nanoscale elastic properties. Atomic force acoustic microscopy (AFAM) makes use of the resonant frequencies of an AFM cantilever while its tip contacts the sample surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50330

35. Elastodynamic characterization of imprinted nanolines
Published: 4/3/2006
Authors: Ward L Johnson, Colm Flannery, Sudook A. Kim, Roy H. Geiss, Christopher L Soles, Paul R Heyliger
Abstract: Experimental techniques employing Brillouin light scattering (BLS) and analytical techniques employing finite-element (FE) and Farnell-Adler models are being developed for characterizing acoustic modes and determining elastic moduli and dimensions o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50332

36. Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods
Published: 9/23/2005
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos, Roy H. Geiss
Abstract: We describe a dynamic atomic force microscopy (AFM) method to measure the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) techniques and involves the resonant ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50024

37. Multilayer and functional coatings on carbon nanotubes using atomic layer deposition
Published: 9/14/2005
Authors: Cari F. Herrmann, F Fabreguette, Dudley Finch, Roy H. Geiss, S M George
Abstract: Atomic layer deposition can be used to deposit ultra thin and conformal films on substrates with very high aspect ratios such as nanotubes and nanowires. In this paper, we demonstrate that functionalized and multilayered ALD coatings can be deposited ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30022

38. Electrical Methods for Mechanical Characterization of Interconnect Thin Films
Published: 9/1/2005
Authors: Robert R Keller, Cynthia A. Volkert, Roy H. Geiss, Andrew J Slifka, David Thomas Read, Nicholas Barbosa, Reiner Monig
Abstract: We describe the use of electrical methods for evaluating mechanical reliability and properties of patterned copper and aluminum interconnects on silicon substrates. The approach makes use of controlled Joule heating, which causes thermal strains in t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50210

39. Contact mechanics and tip shape in afm-based nanomechanical measurements
Published: 8/31/2005
Authors: Malgorzata Kopycinska-Mueller, Roy H. Geiss, Donna C. Hurley
Abstract: Stiffness-load curves obtained in quantitative atomic force acoustic microscopy (AFAM) measurements depend on both the elastic properties of the sample and the geometry of the atomic force microscope (AFM) tip. The geometry of silicon AFM tips change ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50203

40. Quantitative Elastic-Property Measurements at the Nanoscale with Atomic Force Acoustic Microscopy
Published: 8/31/2005
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos, Roy H. Geiss
Abstract: We are developing metrology for rapid, quantitative assessment of elastic porperties with nanoscale spatial resolution. Atomic force acoustic microscopy (AFAM) methods enable modulus measurements at either a single point or as a map of local property ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50097



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