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Author: daniel fischer

Displaying records 201 to 209.
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201. Measuring Structure and Order Development in Organic Semiconductor Films Using Soft X-Ray Spectroscopy
Published: Date unknown
Authors: Dean M DeLongchamp, S Sambasivan, Daniel A Fischer, Eric K Lin, Brandon M. Vogel
Abstract: Paper is abstract.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852539

202. NEXAFS Characterization of Poly(amino acids)
Published: Date unknown
Authors: N T Samuel, Daniel A Fischer, David G. Castner
Abstract: The near-edge x-ray absorption fine structure (NEXAFS) spectra of poly(amino acids) at the carbon, nitrogen and oxygen k-edges are investigated in this study. The poly(amino acid) NEXAFS spectra at the k-edges closely resemble the spectra of the corr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851094

203. Near Edge X-Ray Absorption Fine Structure (NEXAFS) Studies of Metal Ion-Containing PAMAMOS Dendrimer Networks
Published: Date unknown
Authors: Robert A Bubeck, P Dvornic, J Hu, A Hexemer, X Li, S E Keinath, Daniel A Fischer
Abstract: The interaction of Cu2+ with C, N and O moieties in poly(amidoamine-organosilicon) (PAMAMOS/DMOMS) dendrimer networks was characterized at room temperature using near edge X-ray absorption fine structure (NEXAFS). In particular, the effects on the 1 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850811

204. Quantitative Evaluation of Perfluorinated Alkylthiol Molecular Order on Gold Surfaces
Published: Date unknown
Authors: L Gamble, D Radford, Daniel A Fischer, D W Grainger, David G. Castner
Abstract: Self-assembled monolayers (SAMs) of perfluoroalkylthiols [CF^d3^(CF^d2^)^dx^CH^d2^CH^d2^SH (x=3, 5, 7, and 9)] on gold were examined by X-ray photoelectron spectroscopy (XPS), near edge X-ray absorption fine structure (NEXAFS), and static time of fli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850457

205. Reactions of Chlorobenzene on the Pt (111) Surface: A Temperature Programmed Reaction and Fluorescence Yield Near Edge Spectroscopy Study
Published: Date unknown
Authors: B M Haines, G E Mitchell, Daniel A Fischer, J L Gland
Abstract: The surface reactions of chlorobenzene on Pt(111) have been studied using temperature programmed reaction spectroscopy (TPRS) and fluorescence yield near edge spectroscopy (FYNES). Thermal hydrodechlorination, dehydrogenation and rehydrogenation resu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850907

206. Strain-Induced Ferroelectric SrTiO^d3^ Thin Films Grown Coherently on Si(001): Experiment and Theory
Published: Date unknown
Authors: Joseph C Woicik, Eric L Shirley, Daniel A Fischer, S Sambasivan, C R Ashman, C S Hellberg, H Li
Abstract: Ferroelectric crystals possess an electric dipole moment even in the absence of an external electric field. In order for this spontaneous polarization to arise, the center of positive charge of the crystal must displace from its center of negative ch ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850940

207. Synchrotron Based Surface Science to Probe Polymeric Interfacial Regions
Published: Date unknown
Authors: Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Daniel A Fischer
Abstract: Synchrotron based X-ray absorption spectroscopy was utilized to probe the chemistry and structure of polymers in interfacial regions, including the interfacial regions, including the interfacial composition of filled epoxy composites, and the surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850998

208. Synchrotron Based Surface Science to Probe Structure and Chemistry of Polymeric Interfacial Regions
Published: Date unknown
Authors: Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Daniel A Fischer
Abstract: Synchrotron based X-ray absorption spectroscopy was utilized to probe the chemistry and structure of polymers in interfacial regions, including the interfacial composition of filled epoxy composites, and the surface orientation of polymer films. Pol ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851004

209. Understanding Deviations in Lithographic Patterns Near Interfaces: Characterization of Antireflective Coatings (ARC) and the ARC/Resist Interface
Published: Date unknown
Authors: Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Daniel A Fischer, S Sambasivan, Eric K Lin, Wen-Li Wu, Douglas Guerrero, Yijun Wang, R Puligadda
Abstract: Interactions between a bottom anti-reflective coating (BARC) and a photo-resist can critically impact lithographic patterns. For example, a lithographic pattern can shrink or spread near a BARC interface, a process called undercutting or footing res ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850903



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