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Author: michael fasolka

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61. Fourier Analysis Near-Field Polarimetry for Measurement of Local Optical Properties of Thin Films
Published: 1/1/2003
Authors: Lori S. Goldner, Evan L. Thomas, Michael J Fasolka, S Nougier, H P Nguyen, G W Bryant, Jeeseong Hwang, K D Weston, Kathryn L Beers, A Urbas
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853871

62. Measuring Local Optical Properties: Near-Field Polarimetry of Photonic Block Copolymer Morphology
Published: 1/1/2003
Authors: Michael J Fasolka, Lori S. Goldner, Jeeseong Hwang, A Urbas, P DeRege, T Swager, Evan L. Thomas
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853848

63. Near-Field Polarimetric Characterization of Semi-Crystalline Polymer Systems
Published: 1/1/2003
Authors: S N Goldie, Michael J Fasolka, Lori S. Goldner, Jeeseong Hwang, Kathryn L Beers
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853855

64. Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research
Published: 1/1/2003
Authors: Sangcheol Kim, A Sehgal, Alamgir Karim, Michael J Fasolka
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853897

65. Techniques for Combinatorial and High-Throughput Microscopy. Part 1: Gradient Specimen Fabrication for Polymer Thin Films Research
Published: 1/1/2003
Authors: A Sehgal, Alamgir Karim, Christopher M Stafford, Michael J Fasolka
Abstract: Combinatorial and high-throughput (C&HT) approaches accelerate research by addressing multiple experimental parameters in a parallel highly efficient fashion. As with traditional materials science, microscopy and imaging of morphology are essential ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852240

66. Near-Field Optical Imaging of Microphase Separated and Semi-Crystalline Polymer Systems
Published: 1/1/2002
Authors: Michael J Fasolka, Lori S. Goldner, A Urbas, Jeeseong Hwang, Kathryn L Beers, P DeRege, Evan L. Thomas
Abstract: Polymer self-assembly presents an attractive means of creating the micro- and nano-patterned spatial arrays required for many opto-electronic and coatings technologies. Two of these ordering processes are microphase separation (MS), exhibited by blo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852003

67. Block Copolymer Thin Films: Physics and Applications
Published: 2/15/2001
Authors: Michael J Fasolka, A M Mayes
Abstract: A two-part review of research concerning block copolymer thin films is presented. The first section summarizes experimental and theoretical studies of the fundamental physics of these systems, concentrating upon the forces that govern film morpholog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841503

68. Newton's Rings in Near-Field Optics
Published: 1/1/2001
Authors: Lori S. Goldner, Jeeseong Hwang, Garnett W Bryant, Michael J Fasolka, P Absil, J V Hryniewicz, F G Johnson, H Shen, P T Ho
Abstract: We show how Newton's rings manifest themselves in near-field scanning optical microscopy and discuss how this effect can be used with topographic imaging to measure correlated roughness of thin films. In conventional optics, transmission through a th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841472

69. Enhancing Sensitivity of Atomic Force Microscopy for Characterization ofSurface Chemical Heterogeneity
Published: Date unknown
Authors: Xiaohong Gu, Tinh Nguyen, Michael J Fasolka, Mark R VanLandingham, Jonathan W. (Jonathan W.) Martin
Abstract: Atomic force microscopy (AFM) has played an increasingly important role in characterizing surface morphology and surface properties of materials. However, the ability to identify and map the surface chemical heterogeneity has remained an unfulfilled ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860524

70. Interaction of Surface Free Energy and Humidity on AFM Tip-Sample Adhesion Measured by Chemical Force Microscopy
Published: Date unknown
Authors: Lei Chen, Tinh Nguyen, Xiaohong Gu, D Julthongpiput, Michael J Fasolka, Jonathan W. (Jonathan W.) Martin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860640