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Author: william estler

Displaying records 31 to 37.
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31. The Calculation of CMM Measurement Uncertainty via The Method of Simulation by Constraints
Published: 1/1/1997
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, David E Ward, K Eberhardt, M. Levenson, Marjorie A McClain, B Melvin, Ted Hopp, Y Shen
Abstract: The calculation of task specific measurement uncertainty when using coordinate measuring machines is an important and challenging task. Current methods to address this issue use simulation techniques (e.g., the virtual CMM) where the propagation of k ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820857

32. Error Compensation for CMM Touch Trigger Probes
Published: 10/1/1996
Authors: William Tyler Estler, Steven David Phillips, Bruce R. Borchardt, Ted Hopp, G Witzgall, M Levenson, K Eberhardt, Marjorie A McClain, Y Shen, X Zhang
Abstract: We present the analysis of a simple mechanical model of a common type of kinematic seat touch trigger probe widely used on modern coordinate measuring machines (CMMs). The model provides a quantitative description of the pretravel variation or probe- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822130

33. Self-Calibration: Reversal, Redundancy, Error Separation, and "Absolute Testing"
Published: 1/1/1996
Authors: Christopher J. Evans, R Hocken, William Tyler Estler
Abstract: Over the years many techniques have been developed for accurate measurement of part features without reference to an externally calibrated artifact. This paper presents a partial survey of such methods for dimensional metrology, their ranges of appli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820791

34. The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5698
Published: 2/1/1995
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820754

35. Error Compensation for CMM Touch Trigger Probes
Published: 1/1/1995
Authors: William Tyler Estler, Steven David Phillips, Bruce R. Borchardt, Ted Hopp, Christoph Johann Witzgall, M Levenson, et al
Abstract: We present the analysis of a simple mechanical model of a common type of kinematic seat touch trigger probe widely used on modem coordinate measuring machines (CMMs). The model provides a quantitative description of the pre-travel variation or probe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820736

36. Surface Metrology of Soft X-ray Optics
Published: 1/1/1993
Authors: Theodore Vincent Vorburger, T. McWade, Joseph Fu, Christopher J. Evans, William Tyler Estler, R Parks
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901970

37. XUV Optics Characterization at the National Institute of Standards and Technology
Published: 1/1/1993
Authors: R N. Watts, Charles S Tarrio, Thomas B Lucatorto, R P. Madden, R Deslattes, Ariel Caticha, William Tyler Estler, Christopher J. Evans, T. McWade, Joseph Fu, Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901965



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