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You searched on: Author: kevin coakley

Displaying records 41 to 50 of 57 records.
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41. Calibration of a Stopping Power Model for Silicon Based on Analysis of Neutron Depth Profiling and Secondary Ion Mass Spectrometry Measurements
Published: 6/1/2002
Authors: Kevin J Coakley, Huaiyu H Chen-Mayer, George Paul Lamaze, David S Simons, P E Thompson
Abstract: We measure the boron concentration versus depth profile within a silicon sample with four delta-doped planes by secondary ion mass spectrometry. In a neutron depth profiling (NDP) experiment, we illuminate the sample with a neutron beam. Nuclear re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151806

42. Estimation of the Neutron Lifetime: Comparison of Methods Which Account for Background
Published: 6/1/2002
Authors: Kevin J Coakley, Grace L Yang
Abstract: In the first stage of each run of a neutron lifetime experiment, a magnetic trap is filled with neutrons. In the second stage of each run, neutron decay events are observed. In a separate experiment of multiple runs, only background signals are mea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151781

43. Uncertainty of Oscilloscope Timebase Distortion Estimate
Published: 2/1/2002
Authors: Chih-Ming Wang, Paul D Hale, Kevin J Coakley, Tracy S. Clement
Abstract: We study several problems related to the characterization of the timebase in high-speed sampling oscilloscopes. First, we examine the bias of using the method of the first-order approximation to estimate the additive and time jitter noises, and prese ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30093

44. A Weekly Cycle in Atmospheric Carbon Dioxide
Published: 1/1/2002
Authors: R S Cerveny, Kevin J Coakley
Abstract: We present a new statistic called the Mean Symmetrized Residual (MSR) for detection and quantification of a weekly cycle in measured daily atmospheric carbon dioxide (CO^d2^). At the Mauna Loa Observatory in Hawaii, we conclude that CO^d2^ concentra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151772

45. Neutron Lifetime Experiments Using Magnetically Trapped Neutrons: Optimal Background Correction Strategies
Published: 8/1/2001
Author: Kevin J Coakley
Abstract: In the first stage of each run of a neutron lifetime experiment, a magnetic trap is filled with neutrons. In the second stage of each run, decay events plus background events are observed. In a separate experiment, background ismeasured. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151774

46. Alignment of Noisy Signals
Published: 2/1/2001
Authors: Kevin J Coakley, Paul D Hale
Abstract: We study the relative performance of various methods for aligning noisy one dimensional signals. In each method, we estimate the relative shifts of a set of signals which are translated with respect to each other. We simulate signals corrupted by bot ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901379

47. Guest Editorial: Advances in Quantitative Image Analysis
Published: 1/1/2001
Authors: Kevin J Coakley, M Levenson
Abstract: Kevin Coakley and Mark Levenson were invited to solicit papers on Quantitative Imaging for a special issue of the International Journal of Imaging Systems and TEchnology. They briefly describe the papers in a commentary that will appear in the speci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151771

48. Likelihood Models for Two-Stage Neutron Lifetime Experiments
Published: 1/1/2001
Authors: Grace L Yang, Kevin J Coakley
Abstract: At the NIST Cold Neutron Research Facility, a multiple run neutron lifetime experiment is underway. Each run of the two-stage experiment consists of a neutron production stage and a neutron decay stage. Salient features of the experimental data are ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151766

49. Lumped-Element Models for On-Wafer Calibration
Published: 12/1/2000
Authors: David K Walker, Raian K. Kaiser, Dylan F Williams, Kevin J Coakley
Abstract: We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped sta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30211

50. Time-Domain Measurement of the Frequency Response of High-Speed Photoreceivers to 50 GHz
Published: 9/1/2000
Authors: Tracy S. Clement, Paul D Hale, Kevin J Coakley, Chih-Ming Wang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9815



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