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Author: wei chu
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1.
Development of Ballistics Identification – From Image Comparison to Topography Measurement in Surface Metrology-
Published: 3/22/2012
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Thomas B Renegar, Xiaoyu A Zheng, James H Yen, Richard M Silver, Wei Chu
Abstract: Fired bullets and ejected cartridge cases have unique ballistics signatures left by the firearm. By analyzing the ballistics signatures, forensic examiners can trace these bullets and cartridge cases to the firearm used in a crime scene. Current au
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908043
2.
Selecting Valid Correlation Areas for Automated Bullet Identification Systems Based on Striation Detection
Published: 5/1/2011
Authors: Wei Chu, Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Richard M Silver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905104
3.
Striation Density for Predicting the Identifiability of Fired Bullets
Published: 9/1/2010
Authors: Wei Chu, Jun-Feng Song, Theodore Vincent Vorburger, Susan M Ballou
Abstract: Without a selection procedure to exclude the bullets having insufficient individualized ballistics signature, automated ballistics identification systems will correlate an evidence bullet with all reference bullets stored in the database. Correlation
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901713
4.
Subpixel Image Stitching for Linewidth Measurement Based on Digital Image Correlation
Published: 8/13/2010
Authors: Wei Chu, Joseph Fu, Theodore Vincent Vorburger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903899
5.
Topography measurements for correlations of standard cartridge cases
Published: 7/1/2010
Authors: Theodore Vincent Vorburger, Jun-Feng Song, Wei Chu, Thomas B Renegar, Xiaoyu A Zheng, James H Yen, Robert Meryln Thompson, Richard M Silver, Benjamin Bachrach, Martin Ols
Abstract: NIST Standard Reference Materials (SRM) 2460 Standard Bullets and 2461 Standard Cartridge Cases are intended for use as check standards for crime laboratories to help verify that their computerized optical imaging equipment for ballistics image acqui
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905846
6.
Optimal Compression and Binarization of Signature Profiles for Automated Bullet Identification Systems
Published: 5/1/2010
Authors: Wei Chu, Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Thomas B Renegar, Richard M Silver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905570
7.
Applications of Cross-Correlation Functions
Published: 4/14/2010
Authors: Theodore Vincent Vorburger, Jun-Feng Song, Wei Chu, Li Ma, Xiaoyu A Zheng, Thomas B Renegar, Son H Bui
Abstract: We describe several examples where we use cross-correlation functions to quantify the similarity of 2D surface profiles or of 3D surface topography images. The applications have included 1) the manufacture of Standard Reference Material (SRM) bullet
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902481
8.
Pilot Study of Automated Bullet Signature Identification Based on Topography Measurements and Correlations
Published: 3/1/2010
Authors: Wei Chu, Jun-Feng Song, Theodore Vincent Vorburger, James H Yen, Susan M Ballou, Benjamin Bachrach
Abstract: A procedure for automated bullet signature identification is described based on topography measurements using confocal microscope and correlations calculation. Automated search and retrieval systems are widely used for comparison of firearms evidence
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824708
9.
An Iterative Image Registration Algorithm by Optimizing Similarity Measurement
Published: 1/1/2010
Authors: Wei Chu, Li Ma, Jun-Feng Song, Theodore Vincent Vorburger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903937
10.
An Improved Digital Image Correlation Method Applied to Scanning Probe Microscope Images
Published: 10/1/2009
Authors: Wei Chu, Joseph Fu, Theodore Vincent Vorburger
Abstract: Digital image correlation (DIC) is a method for measuring the surface displacements and displacement gradients in materials under deformation. During the calculation, the traditional DIC method directly uses the intensity values of compared images an
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903160