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NIST's Liddle, Spielman Elected APS Fellows

From NIST Tech Beat: December 12, 2012

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Contact: Chad Boutin

Two scientists at the National Institute of Standards and Technology (NIST), Alex Liddle and Ian Spielman, have been elected Fellows of the American Physical Society (APS). The status of fellow is limited to no more than one half of one percent of the APS membership and is awarded to recognize outstanding contributions to physics.

J. Alexander Liddle of NIST’s Center for Nanoscale Science and Technology (CNST) was nominated for APS Fellowship by the Forum on Industrial and Applied Physics (FIAP). His APS citation is “for contributions to the science and technology of nanofabrication and nanolithography, including projection electron beam lithography, high-resolution X-ray optics, diblock copolymer and chemically amplified resists, and the directed assembly and metrology of nanoparticle structures.” Liddle will receive his fellowship award at the annual APS meeting on March 19, 2013, in Baltimore, Md.

Ian Spielman of NIST’s Quantum Measurement division was nominated by the APS Division of Atomic, Molecular and Optical Physics (DAMOP). His citation is “for innovative and pioneering work in quantum phenomena at the intersection of atomic and condensed matter physics, using quantum simulation with ultracold atoms, including the use of optical interactions to create artificial electromagnetic fields and spin-orbit coupling.” Spielman will receive his award at the DAMOP annual meeting, which will be held June 3-7, 2013, in Quebec City in Canada.