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Physical Measurement Laboratory /Time and Frequency Division

Phase Noise Metrology Group

NIST's Phase Noise Metrology Group has the world's most advanced measurement and calibration facilities for characterizing noise components in oscillators and frequency synthesizers. It engages in many activities to determine the cause of various kinds of noise for the purpose of isolating and reducing it, ultimately leading to improved components, instruments and techniques that are often necessary for new applications.

Measurement device for signals in the W band (75-110 GHz)
Phase and Amplitude Noise Metrology
5 MHz Graph of phase noise vs. offset frequency showing NIST synthesized signal, Wenzel OXCO, and BVA oscilloquartz.
Low-Phase Noise Frequency Synthesis
Image of AM/PM Noise Calibration Standard device made by NIST
Phase and Amplitude Noise Calibration Services

Noise, present everywhere, causes a signal source to deviate from its ideal performance. It introduces time-dependent, random fluctuations in the frequency, phase and amplitude of a signal. These fluctuations due to noise manifest themselves as frequency modulation (FM), phase modulation (PM) and amplitude modulation (AM) of the ideal carrier. The spectral purity and frequency stability of a signal are characterized in terms of these modulation noise types. 

The goals of NIST’s Phase Noise Metrology Group are to: (1) support high-precision noise measurements, (2) contribute to fundamental improvements in spectral purity of oscillators and frequency synthesizers, and (3) provide certified state-of-the-art PM and AM noise measurement capabilities to National Measurement Institutes (NMIs), US military, industrial and commercial organizations.

Projects and Programs

Web interface to control and monitor the servo with interactive blocks

Field Programmable Gate Array (FPGA) Designs for Metrology

Ongoing
Until recently, the precision measurement of phase noise, spectral purity, and related quantities had been a challenging process, with only a handful of qualified experts in the world. However, Field Programmable Gate Array (FPGA) based measurement systems, similar to software defined radio (SDR)
5 MHz Graph of phase noise vs. offset frequency showing NIST synthesized signal, Wenzel OXCO, and BVA oscilloquartz.

Low-Phase Noise Frequency Synthesis

Ongoing
Frequency synthesis plays an essential role in virtually all present-day commercial, industrial, and military technologies. State-of-the-art low-noise frequency synthesis is a crucial technical asset to high-resolution imaging and radar, high-speed telecommunications, and efficient management of the
Image of AM/PM Noise Calibration Standard device made by NIST

Phase and Amplitude Noise Calibration Services

Ongoing
The primary responsibility of the Phase Noise Metrology Group is to develop and provide calibration services for industrial, military, and commercial organizations to support the core mission of NIST. The PM and AM noise measurements require traceability and certification of devices such as phase
Measurement device for signals in the W band (75-110 GHz)

Phase and Amplitude Noise Metrology

Ongoing
The group provides high-precision measurement of electromagnetic signals in the radio-frequency, microwave and optical range. These measurements include phase noise, amplitude noise and perturbations due to vibration and temperature. Such precision measurements support high-value applications such

Publications

30 GHz regenerative frequency divide-by-3

Author(s)
Archita Hati, Marco Pomponio, Connor Humiston, John Lettang, Craig Nelson
We report the performance of a 30 GHz to 10 GHz regenerative frequency divider. The proposed divider design incorporates the conventional Miller regenerative

PATENTS

  1. V. Gerginov, Two-Photon Optical Frequency Reference with Active AC Stark Shift Cancellation, Provisional Patent Application # 62,629,800
  2. A. Hati, C.W. Nelson, D.A. Howe, Phase Modulation Noise Reducer, United States, Patent # 10,050,608.
  3. D.A. Howe, A. Sen Gupta, C.W. Nelson, and F.L. Walls, High Spectral Purity Microwave Oscillator Using Air-Dielectric Cavity, United States Patent # 7,075,378
  4. F.L. Walls, Calibration System for Determining the Accuracy of Phase Modulation and Amplitude Modulation Noise Measurement Apparatus, United States Patent # 5,172,064
  5. F.L. Walls, Frequency Calibration Standard Using a Wide Band Phase Modulator, United States Patent # 5,101,506
  6. F.L. Walls, Method and Apparatus for Wide Band Phase Modulation, United States Patent # 4,968,908
  7. F.L. Walls and J.R. Vig, Acceleration Insensitive Oscillator, United States Patent # 4,575,690

Awards

David A. Howe

2018 IEEE Fellow - David A. Howe

David A. Howe, NIST and Colorado University Professional Research Advisor, from Boulder, Colorado, USA has been named an IEEE Fellow. He is

Job Openings

Our group has periodic openings for Postdoctoral Fellows, Visiting Scientists, and Graduate Students. Please contact us for more information.

Contacts

Group Leader

Calibration Leader