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Nanoscale Metrology Group


The Nanoscale Metrology Group in the Semiconductor & Dimensional Metrology Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST), develops length measurement science and technology for advanced manufacturing nanotechnology and nanoscience, including time-resolved length.  This measurement capability is critically needed, for example, by the semiconductor manufacturing industry for continued scaling and device integration, and for next-generation technology devices.  The Group disseminates the SI base unit of length down to the atomic scale, and the derived units of acceleration and acoustic pressure.  Current focus areas include three-dimensional metrology of nanostructures including nanoparticles; micro- and nano-fluidic devices; and micro-electromechanical systems (MEMS).  The Group develops and applies displacement interferometry and advanced microscopy methods such as scanning electron, atomic force, helium ion, and optical.

Nanoscale Metrology

Micro- and Nanoelectromechanical Systems—Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical diagnostics, among others. They have become ubiquitous …

Acceleration, Vibration, and Acoustics—The Acceleration, Vibration, and Acoustics Project provides measurement services, and develops measurements and documentary standards for the SI units of acceleration, sound pressure, and …

Three-Dimensional Nanometer Metrology—Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the present and future generations of semiconductor and …

Nanoparticle Manipulation Metrology—We are advancing the measurement of dimension and function of engineered nanoparticles for biomedical research, manufacturing, and environmental health & safety impact studies through the …


Physical Measurement Laboratory (PML)
Semiconductor & Dimensional Metrology Division

Nanoscale Metrology Group (683.03)
Dr. John A. Kramar, Leader

General Information:
Regenia M. McCloud, Secretary
301-975-3488 Telephone
301-869-0822 Facsimile

100 Bureau Drive, M/S 8212
Gaithersburg, Maryland 20899-8212