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NIST Home > Optical Properties of Materials Information at NIST 

Optical Properties of Materials Information at NIST

(the links below are a compilation of programs and projects, news/events, and other pages tagged with this term)

 
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Beamline 2: Spectrometer Calibrations (10/03/2011)
Bidirectional optical scattering facility (10/24/2012)
Bilateral Comparison of Spectral Responsivity in the Vacuum-Ultraviolet (11/16/2012)
Color and appearance (10/17/2012)
Color and appearance metrology facility (10/03/2012)
Complete hemispherical infrared laser-based reflectometer (CHILR) (10/05/2010)
EUV Detector Radiometry Beamline (10/03/2011)
Extreme Darkness: Carbon Nanotube Forest Covers NIST’s Ultra-dark Detector (10/03/2011)
Fourier transform infrared spectrophotometry (FTIS) facility (10/05/2010)
Geostationary Operations Environment Satellite R-Series Program (GOES-R) Extreme UV/X-ray Irradiance Sensor (EXIS) Calibration (11/19/2012)
Goniophotometer for specular gloss calibrations (10/02/2012)
Highlight about alternative material for relfectance standards (10/12/2011)
Highlight about investigating nanoscale pattern shape evolution (10/05/2010)
Highlight about quality system recognition (12/17/2012)
Infrared laser gonioreflectometer instrument (ILGRI) (10/05/2010)
< Previous 1 2 3 4 Next »

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Date created: April 2, 2010 | Last updated: May 24, 2010    Contact: Webmaster