Journal of Research Volume 98

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

The NIST Cold Neutron Research Facility, p. 1
Prask, H.J.; Rowe, J.M.; Rush, J.J.; Schroder, L.G.
http://dx.doi.org/10.6028/jres.098.001

Outline of neutron scattering formalism, p. 15
Arif, M.; Dewey, M.S.; Greene, G.L.; Snow, W.M.
http://dx.doi.org/10.6028/jres.098.002

Small angle neutron scattering at the National Institute of Standards and Technology, p. 31
Hammouda, B.; Krueger, S.; Glinka, C.J.
http://dx.doi.org/10.6028/jres.098.003

Neutron reflectivity and grazing angle diffraction, p. 47
Ankner, J.F.; Majkrzak, C.F.; Satija, S.K.
http://dx.doi.org/10.6028/jres.098.004

The triple axis and SPINS spectrometers, p. 59
Trevino, S.F.
http://dx.doi.org/10.6028/jres.098.005

Neutron time-of-flight spectroscopy, p. 71
Copley, J.R.D.; Udovic, T.J.
http://dx.doi.org/10.6028/jres.098.006

Ultra-high resolution inelastic neutron scattering, p. 89
Neumann, D.A.; Hammouda, B.
http://dx.doi.org/10.6028/jres.098.007

Neutron depth profiling: Overview and description of NIST facilities, p. 109
Downing, R.G.; Lamaze, G.P.; Langland, J.K.; Hwang, S.T.
http://dx.doi.org/10.6028/jres.098.008

Prompt-gamma activation analysis, p. 127
Lindstrom, R.M.
http://dx.doi.org/10.6028/jres.098.009

Facilities for fundamental neutron physics research at the NIST Cold Neutron Research Facility, p. 135
Arif, M.; Dewey, M.S.; Greene, G.L.; Snow, W.M.
http://dx.doi.org/10.6028/jres.098.010

News briefs, p. 145
http://dx.doi.org/10.6028/jres.098.011

Absolute spatially- and temporally-resolved optical emission measurements of rf glow discharges in argon, p. 159
Djurovic, S.; Roberts, J.R.; Sobolewski, M.A.; Olthoff, J.K.
http://dx.doi.org/10.6028/jres.098.012

Optimizing complex kinetics experiments using least-squares methods, p. 181
Fahr, A.; Braun, W.; Kurylo, M.J.
http://dx.doi.org/10.6028/jres.098.013

Measuring low frequency tilts, p. 191
Kohl, M.L.; Levine, J.
http://dx.doi.org/10.6028/jres.098.014

Optical fiber geometry: Accurate measurement of cladding diameter, p. 203
Young, M.; Hale, P.D.; Mechels, S.E.
http://dx.doi.org/10.6028/jres.098.015

Drift eliminating designs for non-simultaneous comparison calibrations, p. 217
Doiron, T.
http://dx.doi.org/10.6028/jres.098.016

A three-ratio scheme for the measurement of isotopic ratios of silicon, p. 225
Ku, H.; Schaefer, F.; Valkiers, S.; Debievre, P.
http://dx.doi.org/10.6028/jres.098.017

'Wolf Shifts' and their physical interpretation under laboratory conditions, p. 231
Mielenz, K.D.
http://dx.doi.org/10.6028/jres.098.018

Accuracy in Powder Diffraction-II: A report on the Second International Conference - Gaithersburg, Md - May 26-29, 1992, p. 241
Stalick, J.K.
http://dx.doi.org/10.6028/jres.098.019

Metrological issues in precision-tolerance manufacturing: A report of a NIST industry-needs workshop - Gaithersburg, Md - August 11-12, 1992, p. 245
Swyt, D.A.
http://dx.doi.org/10.6028/jres.098.020

Symposium on Optical Fiber Measurements - Boulder, Co - September 15-17, 1992, p. 253
Franzen, D.L.; Day, G.W.
http://dx.doi.org/10.6028/jres.098.021

North American Integrated Services Digital Network (ISDN) Users' Forum (NIUF) - Gaithersburg, Md - October 26-30, 1992, p. 257
Lennon, E.B.
http://dx.doi.org/10.6028/jres.098.022

News briefs, p. 261
http://dx.doi.org/10.6028/jres.098.023

Coil probe dimension and uncertainties during measurements of nonuniform ELF magnetic fields, p. 287
Misakian, M.
http://dx.doi.org/10.6028/jres.098.024

Characteristics of unknown linear systems deduced from measured CW magnitude, p. 297
Ma, M.T.; Adams, J.W.
http://dx.doi.org/10.6028/jres.098.025

X-ray diffraction line broadening: modeling and applications to high-Tc superconductors, p. 321
Balzar, D.
http://dx.doi.org/10.6028/jres.098.026

Evaluation of serum volume losses during long-term storage, p. 355
Craft, N.E.; Epler, K.S.; Butler, T.A.; May, W.E.; Ziegler, R.G.
http://dx.doi.org/10.6028/jres.098.027

Dependence of quantized Hall effect breakdown voltage on magnetic field and current, p. 361
Cage, M.E.
http://dx.doi.org/10.6028/jres.098.028

Workshop on Characterizing Diamond Films II - Gaithersburg, Md - February 24-25, 1993, p. 375
Feldman, A.; Beetz, C.; Klocek, P.; Lu, G.
http://dx.doi.org/10.6028/jres.098.029

NIST-Industry Workshop on thermal spray coatings research - Gaithersburg, Md - July 20, 1992, p. 383
Dapkunas, S.J.
http://dx.doi.org/10.6028/jres.098.030

News briefs, p. 391
http://dx.doi.org/10.6028/jres.098.031

X-ray-lithography mask metrology: Use of transmitted electrons in an SEM for linewidth measurement, p. 415
Postek, M.T.; Lowney, J.R.; Vladar, A.E.; Keery, W.J.; Marx, E.; Larrabee, R.D.
http://dx.doi.org/10.6028/jres.098.032

Interalaboratory study on the lithographically produced scanning electron microscope magnification standard prototype, p. 447
Postek, M.T.; Vladar, A.E.; Jones, S.N.; Keery, W.J.
http://dx.doi.org/10.6028/jres.098.033

Phase equilibria and crystal chemistry in portions of the system SrO-CaO-Bi₂O₃-CuO, Part IV - The System CaO-Bi₂O₃-CuO, p. 469
Burton, B.P.; Rawn, C.J.; Roth, R.S.; Hwang, N.M.
http://dx.doi.org/10.6028/jres.098.034

Compass '93, Eigth Annual Conference on Computer Assurance - Gaithersburg, Md - June 14-17, 1993, p. 517
Wallace, D.R.; Lennon, E.B.
http://dx.doi.org/10.6028/jres.098.035

Workshop on Aging, Dimensional Stability, and Durability Issues in High Technology Polymers - Gaithersburg, Md - May 28-29, 1992, p. 523
Arnoldmckenna, C.; Mckenna, G.B.
http://dx.doi.org/10.6028/jres.098.036

News briefs, p. 535
http://dx.doi.org/10.6028/jres.098.037

Transformation of BCC and B2 high temperature phases to HCP and orthorhombic structures in the Ti-Al-Nb system . Part I: Microstructural predictions based on a subgroup relation between phases, p. 561
Bendersky, L.A.; Roytburd, A.; Boettinger, W.J.
http://dx.doi.org/10.6028/jres.098.038

Transformation of BCC and B2 high temperature phases to HCP and orthorhombic structures in the Ti-Al-Nb system . Part II: Experimental TEM study of microstructures, p. 585
Bendersky, L.A.; Boettinger, W.J.
http://dx.doi.org/10.6028/jres.098.039

Corrosion characteristics of silicon carbide and silicon nitride, p. 607
Munro, R.G.; Dapkunas, S.J.
http://dx.doi.org/10.6028/jres.098.040

North American Integrated Services Digital Network (ISDN) Users Forum (NIUF) - Gaithersburg, Md - June 22-25, 1993, p. 633
Lennon, E.B.
http://dx.doi.org/10.6028/jres.098.041

News briefs, p. 637
http://dx.doi.org/10.6028/jres.098.042

Cl/Cl-36 accelerator-mass-spectrometry standards: Verification of their serial-dilution-solution preparations by radioactivity measurements, p. 653
Colle, R.; Thomas, J.W.L.
http://dx.doi.org/10.6028/jres.098.043

Pressure-volume-temperature relations in liquid and solid tritium, p. 679
Grilly, E.R.
http://dx.doi.org/10.6028/jres.098.044

Filter transmittance measurements in the infrared, p. 691
Migdall, A.L.; Frenkel, A.; Kelleher, D.E.
http://dx.doi.org/10.6028/jres.098.045

On two numerical techniques for light scattering by dielectric agglomerated structures, p. 699
Lakhtakia, A.; Mulholland, G.W.
http://dx.doi.org/10.6028/jres.098.046

Wavelengths and energy levels of neutral Kr-84 and level shifts in all Kr even isotopes, p. 717
Kaufman, V.
http://dx.doi.org/10.6028/jres.098.047

Third International Conference on Chemical Kinetics - reactions in gas and condensed media - Gaithersburg, Md - July 12-16, 1993, p. 725
Huie, R.E.
http://dx.doi.org/10.6028/jres.098.048

Data Administration Management Association Symposium -Gaithersburg, Md -May 11-12, 1993, p. 729
Newton, J.
http://dx.doi.org/10.6028/jres.098.049

Issue 1	Issue 2
Issue 3	Issue 4
Issue 5	Issue 6

Journal of Research of NIST

Volume 98

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6

Issue 1 January 1993

Issue 2 March 1993

Issue 3 May 1993

Issue 4 July 1993

Issue 5 September 1993

Issue 6 November 1993

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