Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 98

 ISSN: 1044-677X

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6




Issue 1 January 1993

 

The NIST Cold Neutron Research Facility, p. 1
Prask, H.J.; Rowe, J.M.; Rush, J.J.; Schroder, L.G.
http://dx.doi.org/10.6028/jres.098.001

Outline of neutron scattering formalism, p. 15
Arif, M.; Dewey, M.S.; Greene, G.L.; Snow, W.M.
http://dx.doi.org/10.6028/jres.098.002

Small angle neutron scattering at the National Institute of Standards and Technology, p. 31
Hammouda, B.; Krueger, S.; Glinka, C.J.
http://dx.doi.org/10.6028/jres.098.003

Neutron reflectivity and grazing angle diffraction, p. 47
Ankner, J.F.; Majkrzak, C.F.; Satija, S.K.
http://dx.doi.org/10.6028/jres.098.004

The triple axis and SPINS spectrometers, p. 59
Trevino, S.F.
http://dx.doi.org/10.6028/jres.098.005

Neutron time-of-flight spectroscopy, p. 71
Copley, J.R.D.; Udovic, T.J.
http://dx.doi.org/10.6028/jres.098.006

Ultra-high resolution inelastic neutron scattering, p. 89
Neumann, D.A.; Hammouda, B.
http://dx.doi.org/10.6028/jres.098.007

Neutron depth profiling: Overview and description of NIST facilities, p. 109
Downing, R.G.; Lamaze, G.P.; Langland, J.K.; Hwang, S.T.
http://dx.doi.org/10.6028/jres.098.008

Prompt-gamma activation analysis, p. 127
Lindstrom, R.M.
http://dx.doi.org/10.6028/jres.098.009

Facilities for fundamental neutron physics research at the NIST Cold Neutron Research Facility, p. 135
Arif, M.; Dewey, M.S.; Greene, G.L.; Snow, W.M.
http://dx.doi.org/10.6028/jres.098.010

News briefs, p. 145
http://dx.doi.org/10.6028/jres.098.011


Issue 2 March 1993

 

Absolute spatially- and temporally-resolved optical emission measurements of rf glow discharges in argon, p. 159
Djurovic, S.; Roberts, J.R.; Sobolewski, M.A.; Olthoff, J.K.
http://dx.doi.org/10.6028/jres.098.012

Optimizing complex kinetics experiments using least-squares methods, p. 181
Fahr, A.; Braun, W.; Kurylo, M.J.
http://dx.doi.org/10.6028/jres.098.013

Measuring low frequency tilts, p. 191
Kohl, M.L.; Levine, J.
http://dx.doi.org/10.6028/jres.098.014

Optical fiber geometry: Accurate measurement of cladding diameter, p. 203
Young, M.; Hale, P.D.; Mechels, S.E.
http://dx.doi.org/10.6028/jres.098.015

Drift eliminating designs for non-simultaneous comparison calibrations, p. 217
Doiron, T.
http://dx.doi.org/10.6028/jres.098.016

A three-ratio scheme for the measurement of isotopic ratios of silicon, p. 225
Ku, H.; Schaefer, F.; Valkiers, S.; Debievre, P.
http://dx.doi.org/10.6028/jres.098.017

'Wolf Shifts' and their physical interpretation under laboratory conditions, p. 231
Mielenz, K.D.
http://dx.doi.org/10.6028/jres.098.018

Accuracy in Powder Diffraction-II: A report on the Second International Conference - Gaithersburg, Md - May 26-29, 1992, p. 241
Stalick, J.K.
http://dx.doi.org/10.6028/jres.098.019

Metrological issues in precision-tolerance manufacturing: A report of a NIST industry-needs workshop - Gaithersburg, Md - August 11-12, 1992, p. 245
Swyt, D.A.
http://dx.doi.org/10.6028/jres.098.020

Symposium on Optical Fiber Measurements - Boulder, Co - September 15-17, 1992, p. 253
Franzen, D.L.; Day, G.W.
http://dx.doi.org/10.6028/jres.098.021

North American Integrated Services Digital Network (ISDN) Users' Forum (NIUF) - Gaithersburg, Md - October 26-30, 1992, p. 257
Lennon, E.B.
http://dx.doi.org/10.6028/jres.098.022

News briefs, p. 261
http://dx.doi.org/10.6028/jres.098.023


Issue 3 May 1993

 

Coil probe dimension and uncertainties during measurements of nonuniform ELF magnetic fields, p. 287
Misakian, M.
http://dx.doi.org/10.6028/jres.098.024

Characteristics of unknown linear systems deduced from measured CW magnitude, p. 297
Ma, M.T.; Adams, J.W.
http://dx.doi.org/10.6028/jres.098.025

X-ray diffraction line broadening: modeling and applications to high-Tc superconductors, p. 321
Balzar, D.
http://dx.doi.org/10.6028/jres.098.026

Evaluation of serum volume losses during long-term storage, p. 355
Craft, N.E.; Epler, K.S.; Butler, T.A.; May, W.E.; Ziegler, R.G.
http://dx.doi.org/10.6028/jres.098.027

Dependence of quantized Hall effect breakdown voltage on magnetic field and current, p. 361
Cage, M.E.
http://dx.doi.org/10.6028/jres.098.028

Workshop on Characterizing Diamond Films II - Gaithersburg, Md - February 24-25, 1993, p. 375
Feldman, A.; Beetz, C.; Klocek, P.; Lu, G.
http://dx.doi.org/10.6028/jres.098.029

NIST-Industry Workshop on thermal spray coatings research - Gaithersburg, Md - July 20, 1992, p. 383
Dapkunas, S.J.
http://dx.doi.org/10.6028/jres.098.030

News briefs, p. 391
http://dx.doi.org/10.6028/jres.098.031


Issue 4 July 1993

 

X-ray-lithography mask metrology: Use of transmitted electrons in an SEM for linewidth measurement, p. 415
Postek, M.T.; Lowney, J.R.; Vladar, A.E.; Keery, W.J.; Marx, E.; Larrabee, R.D.
http://dx.doi.org/10.6028/jres.098.032

Interalaboratory study on the lithographically produced scanning electron microscope magnification standard prototype, p. 447
Postek, M.T.; Vladar, A.E.; Jones, S.N.; Keery, W.J.
http://dx.doi.org/10.6028/jres.098.033

Phase equilibria and crystal chemistry in portions of the system SrO-CaO-Bi2O3-CuO, Part IV - The System CaO-Bi2O3-CuO, p. 469
Burton, B.P.; Rawn, C.J.; Roth, R.S.; Hwang, N.M.
http://dx.doi.org/10.6028/jres.098.034

Compass '93, Eigth Annual Conference on Computer Assurance - Gaithersburg, Md - June 14-17, 1993, p. 517
Wallace, D.R.; Lennon, E.B.
http://dx.doi.org/10.6028/jres.098.035

Workshop on Aging, Dimensional Stability, and Durability Issues in High Technology Polymers - Gaithersburg, Md - May 28-29, 1992, p. 523
Arnoldmckenna, C.; Mckenna, G.B.
http://dx.doi.org/10.6028/jres.098.036

News briefs, p. 535
http://dx.doi.org/10.6028/jres.098.037


Issue 5 September 1993

 

Transformation of BCC and B2 high temperature phases to HCP and orthorhombic structures in the Ti-Al-Nb system . Part I: Microstructural predictions based on a subgroup relation between phases, p. 561
Bendersky, L.A.; Roytburd, A.; Boettinger, W.J.
http://dx.doi.org/10.6028/jres.098.038

Transformation of BCC and B2 high temperature phases to HCP and orthorhombic structures in the Ti-Al-Nb system . Part II: Experimental TEM study of microstructures, p. 585
Bendersky, L.A.; Boettinger, W.J.
http://dx.doi.org/10.6028/jres.098.039

Corrosion characteristics of silicon carbide and silicon nitride, p. 607
Munro, R.G.; Dapkunas, S.J.
http://dx.doi.org/10.6028/jres.098.040

North American Integrated Services Digital Network (ISDN) Users Forum (NIUF) - Gaithersburg, Md - June 22-25, 1993, p. 633
Lennon, E.B.
http://dx.doi.org/10.6028/jres.098.041

News briefs, p. 637
http://dx.doi.org/10.6028/jres.098.042


Issue 6 November 1993

 

Cl/Cl-36 accelerator-mass-spectrometry standards: Verification of their serial-dilution-solution preparations by radioactivity measurements, p. 653
Colle, R.; Thomas, J.W.L.
http://dx.doi.org/10.6028/jres.098.043

Pressure-volume-temperature relations in liquid and solid tritium, p. 679
Grilly, E.R.
http://dx.doi.org/10.6028/jres.098.044

Filter transmittance measurements in the infrared, p. 691
Migdall, A.L.; Frenkel, A.; Kelleher, D.E.
http://dx.doi.org/10.6028/jres.098.045

On two numerical techniques for light scattering by dielectric agglomerated structures, p. 699
Lakhtakia, A.; Mulholland, G.W.
http://dx.doi.org/10.6028/jres.098.046

Wavelengths and energy levels of neutral Kr-84 and level shifts in all Kr even isotopes, p. 717
Kaufman, V.
http://dx.doi.org/10.6028/jres.098.047

Third International Conference on Chemical Kinetics - reactions in gas and condensed media - Gaithersburg, Md - July 12-16, 1993, p. 725
Huie, R.E.
http://dx.doi.org/10.6028/jres.098.048

Data Administration Management Association Symposium -Gaithersburg, Md -May 11-12, 1993, p. 729
Newton, J.
http://dx.doi.org/10.6028/jres.098.049

News briefs, p. 733
http://dx.doi.org/10.6028/jres.098.050

*
Bookmark and Share

iso logo
Contact

Information Desk:
301-975-3052 Telephone
301-869-8071 Facsimile
library@nist.gov

100 Bureau Drive, Stop 2500
Gaithersburg, MD 20899-2500