NIST logo

Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal 

Volume 117 (2012)

ISSN: 2165-7254

The Interaction of Radio-Frequency Fields with Dielectric Materials at Macroscopic to Mesoscopic Scales
James Baker-Jarvis, and Sung Kim

Double-Focusing Thermal Triple-Axis Spectrometer at the NCNR
J. W. Lynn, Y. Chen, S. Chang, Y. Zhao, S. Chi, W. Ratcliff II, B. G. Ueland, and R. W. Erwin

Standardization of Broadband UV Measurements for 365 nm LED Sources
George P. Eppeldauer

The Effect of Non-equispaced Sampling Instants, Sub-period Record Epochs, and Timebase Gain on the Information Content of Discretized Replicas of Periodic Signals
N. G. Paulter, Jr.

NIST Ionization Chamber "A" Sample-Height Corrections
Ryan Fitzgerald

Fractional diffusion, low exponent Lévy stable laws, and 'slow motion' denoising of helium ion microscope nanoscale imagery
Alfred S. Carasso, and András E. Vladár

Measurements for the Development of a Simulated Naturally Occurring Radioactive Material
This manuscript is being revised to correct an error in the original regarding a graph in Figure 2. The spectra did not display properly on the graph labeled “Fertilizer”. This version supersedes the version published in April 2012.
L. Pibida

A Comparison of Harwell & FWT Alanine Temperature Coefficients From 25 °C to 80 °C
Marc F. Desrosiers, Anne M. Forney, and James M. Puhl

Computational Seebeck coefficient measurement simulations
Joshua Martin

Instrument Control (iC) – An Open-Source Software to Automate Test Equipment
K. P. Pernstich

Lunar Spectral Irradiance and Radiance (LUSI): New Instrumentation to Characterize the Moon as a Space-Based Radiometric Standard
Allan W. Smith, Steven R. Lorentz, Thomas C. Stone, and Raju V. Datla

Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector
Adolfas K. Gaigalas, Lili Wang, Victoria Karpiak, Yu-Zhong Zhang,and Steven Choquette

A Model for Geometry-Dependent Errors in Length Artifacts
Daniel Sawyer, Brian Parry, Steven Phillips, Chris Blackburn, and Bala Muralikrishnan

Sealed Gravitational Capillary Viscometry of Dimethyl Ether and Two Next-Generation Alternative Refrigerants
Dylan S. Cousins and Arno Laesecke

Variances of Cylinder Parameters Fitted to Range Data
Marek Franaszek

Evolution of Microwave Spectroscopy at the National Bureau of Standards (NBS) and the National Institute of Standards and Technology (NIST)
F.J. Lovas, D.R. Lide Jr., R.D. Suenram, and D.R. Johnson

Reduction Formulae for Products of Theta Functions
P.L. Walker

Evaluation of the Current Status of the Combinatorial Approach for the Study of Phase Diagrams
W. Wong-Ng

Optical-Fiber Power Meter Comparison between NIST and KRISS
I. Vayshenker, S. K. Kim, K. Hong, D.-H. Lee, D. J. Livigni, X. Li, and J. H. Lehman

Bookmark and Share

iso logo

Information Desk:
301-975-3052 Telephone
301-869-8071 Facsimile

100 Bureau Drive, Stop 2500
Gaithersburg, MD 20899-2500