Journal of Research Volume 108

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

Mass Absorption Coefficient of Tungsten and Tantalum, 1450 eV to 2350 eV: Experiment, Theory, and Application, p. 1
Zachary H. Levine, Steven Grantham, Charles Tarrio, David J. Paterson, Ian McNulty, T. M. Levin, Alexei L. Ankudinov, and John J. Rehr
http://dx.doi.org/10.6028/jres.108.002

A Double-Primary Dead-Weight Tester for Pressures (35-175) kPa in Gage Mode, p. 11
Kamlesh Jain, Yueqin Cen, Walter J. Bowers, and James W. Schmidt
http://dx.doi.org/10.6028/jres.108.003

Design and Uncertainty Analysis for a PVTt Gas Flow Standard, p. 21
John D. Wright, Aaron N. Johnson, and Michael R. Moldover
http://dx.doi.org/10.6028/jres.108.004

Potassium Bromate Assay by Redox Titrimetry Using Arsenic Trioxide, p. 49
Johanna M. Smeller and Stefan D. Leigh
http://dx.doi.org/10.6028/jres.108.005

Optical Diffraction in Close Proximity to Plane Apertures. II. Comparison of Half-Plane Diffraction Theories, p. 57
Klaus D. Mielenz
http://dx.doi.org/10.6028/jres.108.006

Uncertainties in Interpolated Spectral Data, p. 69
James L. Gardner
http://dx.doi.org/10.6028/jres.108.007

Quantitative Synthetic Polymer Mass Spectrometry Workshop, p. 79
William E. Wallace, Charles M. Guttman, and Scott D. Hanton
http://dx.doi.org/10.6028/jres.108.008

Accuracy of Nanoscale Pitch Standards Fabricated by Laser-Focused Atomic Deposition, p. 99
Jabez J. McClelland, William R. Anderson, Curtis C. Bradley, Mirek Walkiewicz, Robert J. Celotta, Erich Jurdik, and Richard D. Deslattes
http://dx.doi.org/10.6028/jres.108.0010

Characterization of an Ellipsoidal Radiometer, p. 115
Annageri V. Murthy, Ingrid Wetterlund, and David P. DeWitt
http://dx.doi.org/10.6028/jres.108.011

Interlaboratory Comparison of Magnetic Thin Film Measurements, p. 125
F. C. S. da Silva, C. M. Wang, and D. P. Pappas
http://dx.doi.org/10.6028/jres.108.012

A Primary Dead-Weight Tester for Pressures (0.05-1.0) MPa, p. 135
Kamlesh Jain, Walt Bowers, and James W. Schmidt
http://dx.doi.org/10.6028/jres.108.013

Thermal Conductivity Measurement of an Electron-Beam Physical-Vapor-Deposition Coating, p. 147
A. J. Slifka and B. J. Filla
http://dx.doi.org/10.6028/jres.108.014

Thermal Evaluation of Scorched Graphite-Epoxy Panels by Infrared Scanning, p. 151
A. J. Slifka, T. Hall, and E. S. Boltz
http://dx.doi.org/10.6028/jres.108.015

Amorphous Calcium Phosphate-Based Bioactive Polymeric Composites for Mineralized Tissue Regeneration, p. 167
D. Skrtic, J. M. Antonucci, and E. D. Eanes
http://dx.doi.org/10.6028/jres.108.017

An Experimental Method for Measuring Mechanical Properties of Rat Pulmonary Arteries Verified With Latex, p. 183
E. S. Drexler, A. J. Slifka, J. E. Wright, C. N. McCowan, D. S. Finch, T. P. Quinn, J. D. McColskey, D. D. Ivy, and R. Shandas
http://dx.doi.org/10.6028/jres.108.018

Dependence of Electron Density on Fermi Energy in N-Type Gallium Antimonid, p. 193
Herbert S. Bennett and Howard Hung
http://dx.doi.org/10.6028/jres.108.019

Radiometric Measurement Comparison on the Integrating Sphere Source Used to Calibrate the Moderate Resolution Imaging Spectroradiometer (MODIS) and the Landsat 7 Enhanced Thematic Mapper Plus (ETM+), p. 199
James J. Butler, Steven W. Brown, Robert D. Saunders, B. Carol Johnson, Stuart F. Biggar, Edward F. Zalewski, Brian L. Markham, Paul N. Gracey, James B. Young, and Robert A. Barnes
http://dx.doi.org/10.6028/jres.108.020

Relating Fresh Concrete Viscosity Measurements From Different Rheometers, p. 229
Chiara F. Ferraris and Nicos S. Martys
http://dx.doi.org/10.6028/jres.108.021

Repeatability and Reproducibility Standard Deviations in the Measurement of Trace Moisture Generated Using Permeation Tubes, p. 235
Peter H. Huang and Raghu Kacker
http://dx.doi.org/10.6028/jres.108.022

Review of Instrumented Indentation, p. 249
Mark R. VanLandingham
http://dx.doi.org/10.6028/jres.108.024

Towards High Accuracy Reflectometry for Extreme-Ultraviolet Lithography, p. 267
Charles Tarrio, Steven Grantham, Matthew B. Squires, Robert E. Vet, and Thomas B. Lucatorto
http://dx.doi.org/10.6028/jres.108.025

Virtual Environment for Manipulating Microscopic Particles With Optical Tweezers, p. 275
Yong-Gu Lee, Kevin W. Lyons, Thomas W. LeBrun
http://dx.doi.org/10.6028/jres.108.026

On the Stability of Exponential Backoff, p. 289
Nah-Oak Song, Byung-Jae Kwak, and Leonard E. Miller
http://dx.doi.org/10.6028/jres.108.027

A Link-Level Simulator of the cdma2000 Reverse-Link Physical Layer, p. 299
H. Gharavi, F. Chin, K. Ban, and R. Wyatt-Millington
http://dx.doi.org/10.6028/jres.108.028

New National Air-Kerma-Strength Standards for ¹²⁵I and ¹⁰³Pd Brachytherapy Seeds, p. 337
Stephen M. Seltzer, Paul J. Lamperti, Robert Loevinger, Michael G. Mitch, James T. Weaver, and Bert M. Coursey
http://dx.doi.org/10.6028/jres.108.030

Changes in the U.S. Primary Standards for the Air Kerma From Gamma-Ray Beams, p. 359
Stephen M. Seltzer and Paul M. Bergstrom, Jr.
http://dx.doi.org/10.6028/jres.108.031

Comparison of the NIST and BIPM Medium-Energy X-Ray Air-Kerma Measurements, p. 383
D. T. Burns, M. O'Brien, P. Lamperti, and M. Boutillon
http://dx.doi.org/10.6028/jres.108.032

Optical-Fiber Power Meter Comparison Between NIST and PTB, p. 391
I. Vayshenker, H. Haars, X. Li, J. H. Lehman, and D. J. Livigni
http://dx.doi.org/10.6028/jres.108.033

A Logical Model of Conceptual Integrity in Data Integration, p. 395
David Flater
http://dx.doi.org/10.6028/jres.108.034

Simulation of an Austenite-Twinned-Martensite Interface, p. 413
A. J. Kearsley and L. A. Melara, Jr.
http://dx.doi.org/10.6028/jres.108.036

High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer, p. 429
Rajeev Gupta and Simon G. Kaplan
http://dx.doi.org/10.6028/jres.108.037

Statistical Interpretation of Key Comparison Reference Value and Degrees of Equivalence, p. 439
R. N. Kacker, R. U. Datla, and A. C. Parr
http://dx.doi.org/10.6028/jres.108.038

The Normalized Reduced Form and Cell Mathematical Tools for Lattice Analysis—Symmetry and Similarity, p. 447
Alan D. Mighell
http://dx.doi.org/10.6028/jres.108.039

Evaluation of Intrusion Detection Systems, p. 453
Jacob W. Ulvila and John E. Gaffney, Jr.
http://dx.doi.org/10.6028/jres.108.040

Issue 1	Issue 2
Issue 3	Issue 4
Issue 5	Issue 6

Journal of Research of NIST

Volume 108

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6

Issue 1 January-February 2003

Issue 2 March-April 2003

Issue 3 May-June 2003

Issue 4 July-August 2003

Issue 5 September-October 2003

Issue 6 November-December 2003

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