Journal of Research Volume 107

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

Data Analysis Methods for Synthetic Polymer Mass Spectrometry: Autocorrelation, p. 1
William E. Wallace and Charles M. Guttman
http://dx.doi.org/10.6028/jres.107.005

The 1997 North American Interagency Intercomparison of Ultraviolet Spectroradiometers Including Narrowband Filter Radiometers, p. 19
Kathleen Lantz, Patrick Disterhoft, Edward Early, Ambler Thompson, John DeLuisi, Jerry Berndt, Lee Harrison, Peter Kiedron, James Ehramjian, Germar Bernhard, Lauriana Cabasug, James Robertson, Wanfeng Mou, Thomas Taylor, James Slusser, David Bigelow, Bill Durham, George Janson, Douglas Hayes, Mark Beaubien, and Arthur Beaubien
http://dx.doi.org/10.6028/jres.107.006

Electron-Impact Total Ionization Cross Sections of Hydrocarbon Ions, p. 63
Karl K. Irikura, Yong-Ki Kim, and M. A. Ali
http://dx.doi.org/10.6028/jres.107.007

A Systematic Approach for Multidimensional, Closed-Form Analytic Modeling: Effective Intrinsic Carrier Concentrations in Ga_1-xAl_xAs Heterostructures, p. 69
Herbert S. Bennett and James J. Filliben
http://dx.doi.org/10.6028/jres.107.008

Quantitating Fluorescence Intensity From Fluorophore: The Definition of MESF Assignment, p. 83
Abe Schwatz, Lili Wang, Edward Early, Adolfas Gaigalas, Yu-Zhong Zhang, Gerald E. Marti, and Robert F. Vogt
http://dx.doi.org/10.6028/jres.107.009

The State of the Art and Practice in Digital Preservation, p. 93
Kyong-Ho Lee, Oliver Slattery, Richang Lu, Xiao Tang, and Victor McCrary
http://dx.doi.org/10.6028/jres.107.010

Treasure of the Past X: A Spectroscopic Determination of Scattering Lengths for Sodium Atom Collisions, p. 107
Eite Tiesinga, Carl J. Williams, Paul S. Julienne, Kevin M. Jones, Paul D. Lett, and William D. Phillips
http://dx.doi.org/10.6028/jres.107.011

The Visible Cement Data Set, p. 137
Dale P. Bentz, Symoane Mizell, Steve Satterfield, Judith Devaney, William George, Peter Ketcham, James Graham, James Porterfield, Daniel Quenard, Franck Vallee, Hebert Sallee, Elodie Boller, and Jose Baruchel
http://dx.doi.org/10.6028/jres.107.013

Argon I Lines Produced in a Hollow Cathode Source, 332 nm to 5865 nm, p. 149
W. Whaling, W. H. C. Anderson, M. T. Carle, J. W. Brault, and H. A. Zarem
http://dx.doi.org/10.6028/jres.10714

Water Calorimetry: A Correction to the Heat Defect Calculations, p. 171
Norman V. Klassen and Carl K. Ross
http://dx.doi.org/10.6028/jres.107.015

Exploring Collective Dynamics in Communication Networks, p. 179
Jian Yuan and Kevin Mills
http://dx.doi.org/10.6028/jres.107.016

A Knowledge-Navigation System for Dimensional Metrology, p. 193
Howard T. Moncarz
http://dx.doi.org/10.6028/jres.107.017

Accelerating Scientific Discovery Through Computation and Visualization II, p. 223
James S. Sims, William L. George, Steven G. Satterfield, Howard K. Hung, John G. Hagedorn, Peter M. Ketcham, Terence J. Griffin, Stanley A. Hagstrom, Julien C. Franiatte, Garnett W. Bryant, W. Jaskólski, Nicos S. Martys, Charles E. Bouldin, Vernon Simmons, Oliver P. Nicolas, James A. Warren, Barbara A. am Ende, John E. Koontz, B. James Filla, Vital G. Pourprix, Stefanie R. Copley, Robert B. Bohn, Adele P. Peskin, Yolanda M. Parker, and Judith E. Devaney
http://dx.doi.org/10.6028/jres.107.019

The Role of Rendering in the Competence Project in Measurement Science for Optical Reflection and Scattering, p. 247
Harold B. Westlund, Gary W. Meyer, and Fern Y. Hunt
http://dx.doi.org/10.6028/jres.107.020

Through Measurement to Knowledge: The Inaugural Lecture of Heike Kamerlingh Onnes (1882), p. 261
Arno Laesecke
http://dx.doi.org/10.6028/jres.107.021

A Critical Evaluation of Interlaboratory Data on Total, Elemental, and Isotopic Carbon in the Carbonaceous Particle Reference Material, NIST SRM 1649a, p. 279
L. A. Currie, B. A. Benner, Jr., J. D. Kessler, D. B. Klinedinst, G. A. Klouda, J. V. Marolf, J. F. Slater, S. A. Wise, H. Cachier, R. Cary, J. C. Chow, J. Watson, E. R. M. Druffel, C. A. Masiello, T. I. Eglinton, A. Pearson, C. M. Reddy, O. Gustafsson, P. C. Hartmann, J. G. Quinn, J. I. Hedges, K. M. Prentice, T. W. Kirchstetter, T. Novakov, H. Puxbaum, and H. Schmid
http://dx.doi.org/10.6028/jres.107.022

Effect of Loading Rate Upon Conventional Ceramic Microindentation Hardness, p. 299
George D. Quinn, Parimal J. Patel, and Isabel Lloyd
http://dx.doi.org/10.6028/jres.107.023

Diffractive Optics From Self-Assembled DNA, p. 319
Zachary H. Levine
http://dx.doi.org/10.6028/jres.107.025

Electron-Impact Cross Sections for Dipole- and Spin-Allowed Excitations of Hydrogen, Helium, and Lithium, p. 327
Philip M. Stone, Yong-Ki Kim, and J. P. Desclaux
http://dx.doi.org/10.6028/jres.107.026

Quantitating Fluorescence Intensity From Fluorophores: Practical Use of MESF Values, p. 339
Lili Wang, Adolfas K. Gaigalas, Fatima Abbasi, Gerald E. Marti, Robert F. Vogt, and Abe Schwartz
http://dx.doi.org/10.6028/jres.107.027

Optical Diffraction in Close Proximity to Plane Apertures. I. Boundary-Value Solutions for Circular Apertures and Slits, p. 355
Klaus D. Mielenz
http://dx.doi.org/10.6028/jres.107.028

Development of a Tunable LED-Based Colorimetric Source, p. 363
Steven W. Brown, Carlos Santana, and George P. Eppeldauer
http://dx.doi.org/10.6028/jres.107.029

Conventional Cells–The Last Step Toward General Acceptance of Standard Conventional Cells for the Reporting of Crystallographic Data, p. 373
Alan D. Mighell
http://dx.doi.org/10.6028/jres.107.030

Stability of Standard Electrolytic Conductivity Solutions in Glass Containers, p. 393
Rubina H. Shreiner
http://dx.doi.org/10.6028/jres.107.032

Self-Similarity Simplification Approaches for the Modeling and Analysis of Rockwell Hardness Indentation, p. 401
Li Ma, Jack Zhou, Alan Lau, Samuel Low, and Roland deWit
http://dx.doi.org/10.6028/jres.107.033

Three Improvements in Reduction and Computation of Elliptic Integrals, p. 413
B. C. Carlson
http://dx.doi.org/10.6028/jres.107.034

Influence of the Vertical Emittance on the Calculability of the Synchrotron Ultraviolet Radiation Facility, p. 419
U. Arp
http://dx.doi.org/10.6028/jres.107.035

Lattice Matching (LM)–Prevention of Inadvertent Duplicate Publications of Crystal Structures, p. 425
Alan D. Mighell
http://dx.doi.org/10.6028/jres.107.036

Noise-Parameter Uncertainties: A Monte Carlo Simulation, p. 431
J. Randa
http://dx.doi.org/10.6028/jres.107.037

Transient Green's Tensor for a Layered Solid Half-Space With Different Interface Conditions, p. 445
Shu-Chu Ren, Nelson N. Hsu, and Donald G. Eitzen
http://dx.doi.org/10.6028/jres.107.038

Accurate Cross Sections for Microanalysis, p. 487
Peter Rez
http://dx.doi.org/10.6028/jres.107.041

Optimization of Wavelength Dispersive X-ray Spectometry Analysis Conditions, p. 497
Stephen J. B. Reed
http://dx.doi.org/10.6028/jres.107.042

High Count Rate Electron Probe Microanalysis, p. 503
Joseph D. Geller and Charles Herrington
http://dx.doi.org/10.6028/jres.107.043

Decomposition of Wavelength Dispersive X-Ray Spectra, p. 509
Guy Rémond, Robert Myklebust, Michel Fialin, Clive Nockolds, Matthew Phillips, and Claude Roques-Carmes
http://dx.doi.org/10.6028/jres.107.044

Limitations to Accuracy in Extracting Characteristic Line Intensities From X-Ray Spectra, p. 531
Peter J. Statham
http://dx.doi.org/10.6028/jres.107.045

Averaging of Backscatter Intensities in Compounds, p. 547
John J. Donovan, Nicholas E. Pingitore, Jr., and Andrew J. Westphal
http://dx.doi.org/10.6028/jres.107.046

The Analysis of Particles at Low Accelerating Voltages (< 10 kV) With Energy Dispersive X-Ray Spectroscopy (EDS), p. 555
J. A. Small
http://dx.doi.org/10.6028/jres.107.047

X-Ray Microananlysis in the Variable Pressure (Environmental) Scanning Electron Microscope, p. 567
Dale E. Newbury
http://dx.doi.org/10.6028/jres.107.048

Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy, p. 605
Dale E. Newbury
http://dx.doi.org/10.6028/jres.107.049

The Microcalorimeter for Industrial Applications, p. 621
Del Redfern, Joe Nicolosi, Jens Höhne, Rainer Weiland, Birgit Simmnacher, and Christian Hollerich
http://dx.doi.org/10.6028/jres.107.050

Sample Preparation for Electron Probe Microanalysis–Pushing the Limits, p. 627
Joseph D. Geller and Paul D. Engle
http://dx.doi.org/10.6028/jres.107.051

Implications of Polishing Techniques in Quantitative X-Ray Microanalysis, p. 639
Guy Rémond, Clive Nockolds, Matthew Phillips, and Claude Roques-Carmes
http://dx.doi.org/10.6028/jres.107.052

Copper Oxide Precipitates in NBS Standard Reference Material 482, p. 663
Eric S. Windsor, Robert A. Carlton, Greg Gillen, Scott A. Wight, and David S. Bright
http://dx.doi.org/10.6028/jres.107.053

Smithsonian Microbeam Standards, p. 681
Eugene Jarosewich
http://dx.doi.org/10.6028/jres.107.054

NIST Standards for Microanalysis and the Certification Process, p. 687
R. B. Marinenko
http://dx.doi.org/10.6028/jres.107.055

Contamination in the Rare-Earth Element Orthophosphate Reference Samples, p. 693
John J. Donovan, John M. Hanchar, Phillip M. Picolli, Marc D. Schrier, Lynn A. Boatner, and Eugene Jarosewich
http://dx.doi.org/10.6028/jres.107.056

Characterization of Corning EPMA Standard Glasses 95IRV, 95IRW, and 95IRX, p. 703
Paul Carpenter, Dale Counce, Emily Kluk, and Carol Nabelek
http://dx.doi.org/10.6028/jres.107.057

Microbeam Characterization of Corning Archeological Reference Glasses: New Additions to the Smithsonian Microbeam Standard Collection, p. 719
Edward P. Vicenzi, Stephen Eggins, Amelia Logan, and Richard Wysoczanski
http://dx.doi.org/10.6028/jres.107.058

Issue 1	Issue 2
Issue 3	Issue 4
Issue 5	Issue 6

Journal of Research of NIST

Volume 107

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6

Issue 1 January-February 2002

Issue 2 March-April 2002

Issue 3 May-June 2002

Issue 4 July-August 2002

Issue 5 September-October 2002

Issue 6 November-December 2002

Related Links: