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Journal of Research of the National Institute of Standards and Technology

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology. The Journal of Research is peer-reviewed and indexed by all major indexing services, including Web of Science and Scopus.

When citing articles from the Journal of Research of NIST without issue numbers please use the following format: Kramida, A (2013). "Critically Evaluated Energy Levels and Spectral Lines of Singly Ionized Indium (In II)". Journal of Research of NIST 118: 52.

Starting in 2012, the Journal became an electronic-only publication under a new rapid publication model - papers are published after full review, within 30-45 days of submission. 

Papers published in the Journal of Research of NIST are not subject to copyright in the U.S. Authors may post the formatted versions on their websites.

For additional information see: About the Journal

To submit a manuscript to the Journal: (papers accepted from NIST staff only)


Volume 120 (2015)

ISSN: 2165-7254

Processing and Characterization of Nanoparticle Coatings for Quartz
Crystal Microbalance Measurements

Jessica D. Torrey, Teresa L. Kirschling, and Lauren F. Greenlee
Published January 30, 2015

Report on Pairing-based Cryptography
Dustin Moody, Rene Peralta, Ray Perlner, Andrew Regenscheid, Allen Roginsky, and Lily Chen
Published February 3, 2015

Findings and Recommendations from the NIST Workshop on Alternative Fuels
and Materials: Biocorrosion

Elisabeth Mansfield, Jeffrey W. Sowards, and Wendy J. Crookes-Goodson
Published March 11, 2015

Revision of the NIST Standard for 223Ra: New Measurements and
Review of 2008 Data

B.E. Zimmerman, D.E. Bergeron, J.T. Cessna, R. Fitzgerald, and L. Pibida
Published March 11, 2015

An Areal Isotropic Spline Filter for Surface Metrology
Hao Zhang, Mingsi Tong, and Wei Chu
Published  April 1, 2015

Design and Operation of an Optically-Accessible Modular Reactor for
Diagnostics of Thermal Thin Film Deposition Processes

W.A. Kimes, B. A. Sperling, and J. E. Maslars
Published  April 7, 2015

On the Stability of Rotating Drops
A.K. Nurse, S.R. Coriell, and G.B. McFadden
Published  April 20, 2015

An Improved Algorithm of Congruent Matching Cells (CMC) Method for
Firearm Evidence Identifications

Mingsi Tong, John Song, and Wei Chu
Published  April 29, 2015

SAGRAD: A Program for Neural Network Training with Simulated Annealing and the
Conjugate Gradient Method

Javier Bernal and Jose Torres-Jimenez
Published June 17, 2015

A Simple and Fast Spline Filtering Algorithm for Surface Metrology
Hao Zhang, Daniel Ott, John Song, Mingsi Tong, and Wei Chu
Published July 15, 2015

Development of an Ultra-Pure, Carrier-Free 209Po Solution Standard
R. Collé, R. P. Fitzgerald, and L. Laureano-Perez
Published July 23, 2015

Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and Technology
Randall P. Wagner and William F. Guthrie
Published August 17, 2015

The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference Materials
James P. Cline, Marcus H. Mendenhall, David Black, Donald Windover, and Albert Henins
Published September 25, 2015

An Implementation of the Fundamental Parameters Approach for Analysis of X-ray Powder Diffraction Line Profiles
Marcus H. Mendenhall, Katharine Mullen, and James P. Cline
Published October 21, 2015
Sample code available at:

Rapid Prototyping of Nanofluidic Slits in a Silicone Bilayer
Thomas P. Kole, Kuo-Tang Liao, Daniel Schiffels, B. Robert Ilic, Elizabeth A. Strychalski, Jason G. Kralj, J. Alexander Liddle, Anatoly Dritschilo, and Samuel M. Stavis
Published November 17, 2015

A Journey in Standard Development: The Core Manufacturing Simulation Data (CMSD) Information Model
Yung-Tsun Tina Lee
Published November 17, 2015

Toward Continuous GPS Carrier-Phase Time Transfer: Eliminating the Time Discontinuity at an Anomaly
Jian Yao, Judah Levine, and Marc Weiss
Published November 17, 2015

Smart Electronic Laboratory Notebooks for the NIST Research Environment
Richard S. Gates, Mark J. Mclean, and William A. Osborn
Published December 2, 2015

Certification of NIST Room Temperature Low-Energy and High-Energy Charpy Verification Specimens
Enrico Lucon, Chris N. McCowan, and Ray L. Santoyo
Published December 2, 2015

Morphological and Electrical Characterization of MWCNT Papers and Pellets
Elisabeth Mansfield, Ari Feldman, Ann N. Chiaramonti, John Lehman, and Alexandra E. Curtin
Published December 14, 2015

Potential Stable Low-Permeation Rate Standard Based on Micro-machined Silicon
Adrian Verwolf, Chris Poling, Nick Barbosa, Grady White, and Nikki Rentz
Published December 15, 2015

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