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Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

When citing articles from the Journal of research of NIST without issue numbers please use the following format: Kramida, A (2013). "Critically Evaluated Energy Levels and Spectral Lines of Singly Ionized Indium (In II)". Journal of Research of NIST 118: 52. http://dx.doi.org/10.6028/jres.118.004

Starting in 2012, the Journal became an electronic-only publication under a new rapid publication model - articles are published as soon as we receive them rather than waiting to be published as part of a journal issue. 

For additional information see: About the Journal

To submit a manuscript to the Journal: (NIST staff only)

 

Volume 120 (2015)

ISSN: 2165-7254

Processing and Characterization of Nanoparticle Coatings for Quartz
Crystal Microbalance Measurements

Jessica D. Torrey, Teresa L. Kirschling, and Lauren F. Greenlee
http://dx.doi.org/10.6028/jres.120.001
Published January 30, 2015

Report on Pairing-based Cryptography
Dustin Moody, Rene Peralta, Ray Perlner, Andrew Regenscheid, Allen Roginsky, and Lily Chen
http://dx.doi.org/10.6028/jres.120.002
Published February 3, 2015

Findings and Recommendations from the NIST Workshop on Alternative Fuels
and Materials: Biocorrosion

Elisabeth Mansfield, Jeffrey W. Sowards, and Wendy J. Crookes-Goodson
http://dx.doi.org/10.6028/jres.120.003
Published March 11, 2015

Revision of the NIST Standard for 223Ra: New Measurements and
Review of 2008 Data

B.E. Zimmerman, D.E. Bergeron, J.T. Cessna, R. Fitzgerald, and L. Pibida
http://dx.doi.org/10.6028/jres.120.004
Published March 11, 2015

An Areal Isotropic Spline Filter for Surface Metrology
Hao Zhang, Mingsi Tong, and Wei Chu
http://dx.doi.org/10.6028/jres.120.006
Published  April 1, 2015

Design and Operation of an Optically-Accessible Modular Reactor for
Diagnostics of Thermal Thin Film Deposition Processes

W.A. Kimes, B. A. Sperling, and J. E. Maslars
http://dx.doi.org/10.6028/jres.120.005
Published  April 7, 2015

On the Stability of Rotating Drops
A.K. Nurse, S.R. Coriell, and G.B. McFadden
http://dx.doi.org/10.6028/jres.120.007
Published  April 20, 2015

An Improved Algorithm of Congruent Matching Cells (CMC) Method for
Firearm Evidence Identifications

Mingsi Tong, John Song, and Wei Chu
http://dx.doi.org/10.6028/jres.120.008
Published  April 29, 2015

SAGRAD: A Program for Neural Network Training with Simulated Annealing and the
Conjugate Gradient Method

Javier Bernal and Jose Torres-Jimenez
http://dx.doi.org/10.6028/jres.120.009
Published June 17, 2015

A Simple and Fast Spline Filtering Algorithm for Surface Metrology
Hao Zhang, Daniel Ott, John Song, Mingsi Tong, and Wei Chu
http://dx.doi.org/10.6028/jres.120.010
Published July 15, 2015

Development of an Ultra-Pure, Carrier-Free 209Po Solution Standard
R. Collé, R. P. Fitzgerald, and L. Laureano-Perez
http://dx.doi.org/10.6028/jres.120.011
Published July 23, 2015

Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and Technology
Randall P. Wagner and William F. Guthrie
http://dx.doi.org/10.6028/jres.120.012
Published August 17, 2015


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