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Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

When citing articles from the Journal of research of NIST without issue numbers please use the following format: Kramida, A (2013). "Critically Evaluated Energy Levels and Spectral Lines of Singly Ionized Indium (In II)". Journal of Research of NIST 118: 52.

Starting in 2012, the Journal became an electronic-only publication under a new rapid publication model - articles are published as soon as we receive them rather than waiting to be published as part of a journal issue. 

For additional information see: About the Journal


Volume 119 (2014)

ISSN: 2165-7254

The Dissemination of Mass in the United States: Results and Implications of Recent BIPM Calibrations of US National Prototype Kilograms
Zeina J. Kubarych and Patrick J. Abbott

Are Bragg Peaks Gaussian?
Boualem Hammouda

WWVB: A Half Century of Delivering Accurate Frequency and Time by Radio
Michael A. Lombardi and Glenn K. Nelson

Sensitivity Analysis of Fatigue Crack Growth Model for API Steels in Gaseous Hydrogen
Robert L. Amaro, Neha Rustagi, Elizabeth S. Drexler, and Andrew J. Slifka

Concepts and Engineering Aspects of a Neutron Resonance Spin-Echo Spectrometer for the National Institute of Standards and Technology Center for Neutron Research
Jeremy C. Cook

A Framework for Reproducible Latent Fingerprint Enhancements
Alfred S. Carasso

Threshold Digraphs
Brian Cloteaux, M. Drew LaMar, Elizabeth Moseman, and James Shook

Optical Passive Sensor Calibration for Satellite Remote Sensing and the Legacy of NOAA and NIST Cooperation
Raju Datla, Michael Weinreb, Joseph Rice, B. Carol Johnson, Eric Shirley, and Changyong Cao

Post-Irradiation Study of the Alanine Dosimeter
Marc F. Desrosiers

Translating Radiometric Requirements for Satellite Sensors to Match International Standards
Aaron Pearlman, Raju Datla, Raghu Kacker, and Changyong Cao

Retrospective Analysis of NIST Standard Reference Material 1450, Fibrous Glass Board, for Thermal Insulation Measurements
Robert R. Zarr, N.Alan Heckert, and Stefan D. Leigh

A Review of NIST Primary Activity Standards for 18F: 1982 to 2013
Denis E. Bergeron, Jeffrey T. Cessna, Bert M. Coursey, Ryan Fitzgerald, and Brian E. Zimmerman

Towards a Standard Mixed-Signal Parallel Processing Architecture for Minature and Microrobotics
Brian M. Sadler

Detection of Hazardous Liquids Using Microwaves
Michael D. Janezic, Jolene D. Splett, and Kevin J. Coakley

New National Air-Kerma Standard for Low-Energy Electronic Brachytherapy Sources
Stephen M. Seltzer, Michelle O'Brien, and Michael G. Mitch

Additive Manufacturing Special Issue

Introduction to Special NIST Journal of Research Issue on Additive Manufacturing
John Slotwinski

Mechanical Properties of Austenitic Stainless Steel Made by Additive Manufacturing
William E. Luecke and John A. Slotwinski

Sustainability Characterization for Additive Manufacturing
Mahesh Mani, Kevin W. Lyons, and S.K. Gupta

An Additive Manufacturing Test Artifact
Shawn Moylan, John Slotwinski, April Cooke, Kevin Jurrens, and M. Alkan Donmez

Characterization of Metal Powders Used for Additive Manufacturing
J.A. Slotwinski, E.J. Garboczi, P.E. Stutzman, C.F. Ferraris, S.S> Watson, and M.A. Peltz

Porosity Measurements and Analysis for Metal Additive Manufacturing Process Control
John A. Slotwinski, Edward J. Garboczi, and Keith M. Hebenstreit

Fired Cartridge Case Identification Using Optical Images and the Congruent Matching Cells (CMC) Method
Mingsi Tong, John Song, Wei Chu, and Robert M. Thompson

A Low-Cost Time Transfer Receiver for Contributions to Coordinated Universal Time
Michael A. Lombardi, Andrew N. Novick, and Victor S. Zhang

Erratum: A General Waveguide Circuit Theory
Dylan F. Williams and Roger B. Marks

Erratum: Thermal Expansion of Platinum and Platinum-Rhodium Alloys
R. E. Edsinger, M. L. Reilly, and J. F. Schooley

The Metrology of a Rastered Spot of X Rays used in Security Screening
Lawrence T. Hudson, Jack L. Glover, and Ronaldo Minniti

Analysis of 1-Minute Potentially Available Fluoride from Dentifrice
Clifton M. Carey, Erin C. Holahan, and Burton D. Schmuck

Measurement of Microsphere Concentration Using a Flow Cytometer with Volumetric Sample Delivery
Lili Wang, Yu-Zhong Zhang, Steven Choquette, and A. K. Gaigalas

Optical Properties of CdSe/ZnS Nanocrystals
Adolfas K. Gaigalas, Paul DeRose, Lili Wang, and Yu-Zhong Zhang

Recovery of Background Structures in Nanoscale Helium Ion Microscope Imaging
Alfred S. Carasso and Andras E. Vladar

The Use of Index-Matched Beads in Optical Particle Counters
Zhishang Hu and Dean C. Ripple

The Second National Ballistics Imaging Comparison (NBIC-2)
T.V. Vorburger, J. Yen, J. F. Song, R. M. Thompson, T. B. Renegar, A. Zheng, M. Tong

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