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Nanoelectronics and Nanoscale Electronics Portal

Programs and Projects
Measuring Topological Insulator Surface State Properties

The transmission of information in today’s electronics requires the movement of electrical charge, which expends energy and generates heat, … more

Dimensional Metrology for Nanofabrication

Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively … more

Nanoelectronic Device Metrology

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

CMOS Device and Reliability

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

MEMS Measurement Science and Standards

Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more

Analytical Transmission Scanning Electron Microscopy

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Instruments
Electronic Nanodevices Laboratory

We are developing measurement and fabrication capabilities for nanoscale characterization of electronic nanodevices relevant to energy transport, … more

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General Information:
301-975-NIST (6478) Telephone
inquiries@nist.gov Email

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Technical Contact:
Lloyd Whitman