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Performs research and develops metrology to advance, promote and ensure robust and quantitative microscopy and microanalysis to address stakeholder needs in diverse areas of materials science. Electron, ion, and photon interactions with matter are used to enable the compositional, structural, and morphological characterization of materials from the mesoscale to the atomic scale.
Advanced packaging involves increasingly challenging requirements for heterogeneous integration and chiplet packaging. Needs such as fine pitch interconnects
Projects: Theoretical Calculations of Near-Edge X-ray Spectra Microcalorimeter X-ray Detector X-ray Spectroscopy and Electronic Structure of Solids X-ray Methods for Chemical Imaging at Micro to Mesoscales
A measuring instrument produces a signal that depends upon the value of the measurand. The value and its uncertainty are inferred from the signal by using a model of their relationship. Erroneous models lead to erroneous inference. The accuracy of SEM (scanning electron microscopy) is limited by
Photoemission-based methods that interrogate solid state electronic structure have played a pivotal role in identifying and understanding key features of emerging materials. Band structure information from Angle-Resolved PhotoEmission Spectroscpy (ARPES) provided the first evidence for the d-wave
The Micro and Nanoplastic (MNP) Metrology Project aims to develop a toolbox of methods for size-based separations from complex matrices, chemical characterization protocols, and test materials necessary to enable quantification of micro- and nano-sized plastic particles, a need articulated by our
Pushing the Limits of Measurement Accuracy in Atom Probe Mass Spectrometry Nanoscale Analysis of Biological and Organic Materials Release from Nanocomposite Consumer Products
Isotopic Analysis for Isotopic Geochemistry, Nuclear Safety, and Materials Science : Atom probe tomography has a significant advantage over other forms of mass spectrometry, which typically have a combined efficiency < 5%, in terms of ionization and detection efficiency. Commercial atom probe
Interested in collaborating? See below What does this project do for industry? Current measurement techniques are unable to follow the reaction pathways during catalysis and are limited to observing only the end products or looking at catalysts outside of realistic reaction conditions. Our new
Oleg Senkov, Frederick Meisenkothen, Robert Wheeler
Results of the analysis of deformation twins formed in HfNbTaTiZr refractory high entropy alloy during compression deformation at 20 °C – 600 °C are reported
Frederick Meisenkothen, David Newton, Karen DeRocher, Mark McLean
Atom probe tomography (APT) is emerging as an essential characterization tool in a wide variety of science and engineering fields. For example, APT is helping
OCEAN is a versatile package for calculating both optical/UV and core-edge spectroscopy. It is a first-principles code based on both ground-state density
CLIP is an analysis program for fluorescence lifetime images. It provides the user with the ability to fit or calculate the phasor plots for lifetime decays
LEAP 4000X Si/HR Imaging time-of-flight mass spectrometer and field ion microscope. Can deliver 3-D, isotopically- and chemically- resolved images Sub-nanometer
A TESCAN MIRA3 Schottky field-emission scanning electron microscope with 4 30 mm 2 silicon x-ray drift detectors which has been automated for particle and
The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from hundreds to
The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of
Because of their antimicrobial and antifungal properties, silver nanoparticles measuring between one and 100 nanometers (billionth of a meter) in size, are
By capping liquids with graphene, an ultrathin sheet of pure carbon, researchers at the National Institute of Standards and Technology (NIST) and their