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Microelectronics Programs & Projects

(showing 1 - 8 of 8)
Nanoelectronic Device Metrology
Last Updated Date: 09/30/2014

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

CMOS Device and Reliability
Last Updated Date: 09/29/2014

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

MEMS Measurement Science and Standards
Last Updated Date: 09/29/2014

Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more

COMPLETED: Dimensional Metrology for Nanoscale Patterns
Last Updated Date: 04/17/2014

Our goal is to develop and demonstrate precise measurement methods that quantify the physical shape, critical dimensions (CD) and the structure of … more

Genomics of Electronic Materials
Last Updated Date: 08/08/2013

Our goal is to develop the metrology to enable a materials genomic approach to the discovery and optimization of complex electronic and … more

Magnetodynamics and Spin Electronics
Last Updated Date: 05/13/2013

The Magnetics Group's program in magnetodynamics and spin electronics develops new measurement techniques to characterize the high frequency … more

High Speed Electronics
Last Updated Date: 03/25/2013

This project supports the microwave, telecommunications, computing, and emerging nanoelectronics industries through research and development of … more

Thin Film and Interconnect Reliability
Last Updated Date: 01/04/2013

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such … more

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