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Microelectronics News

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NIST Technique Could Make Sub-wavelength Images at Radio Frequencies
Release Date: 06/17/2014

Imaging and mapping of electric fields at radio frequencies (RF)* currently requires the use of metallic structures such as dipoles, probes and … more

NRI to Lead New Five-Year Effort to Develop Post-CMOS Electronics
Release Date: 10/16/2012

The National Institute of Standards and Technology (NIST) announced today the selection of the Nanoelectronics Research Initiative (NRI), a … more

Three NIST Researchers Earn Presidential Honor
Release Date: 07/25/2012

The White House has announced that three researchers at the National Institute of Standards and Technology (NIST) will receive the 2011 … more

Shaffique Adam Receives Singapore National Research Foundation Fellowship
Release Date: 06/27/2012

In July, Shaffique Adam will join the inaugural faculty of Yale-NUS College as an Assistant Professor of Science, with a joint appointment in the … more

CNST and Sandia Researchers Publish a Detailed Review of Electrical Contacts in One and Two Dimensional Nanomaterials
Release Date: 02/15/2012

Researchers from the NIST Center for Nanoscale Science and Technology and Sandia National Laboratories have published a detailed review of recent … more

NIST Polishes Method for Creating Tiny Diamond Machines
Release Date: 09/27/2011

Diamonds may be best known as a symbol of long-lasting love. But semiconductor makers are also hoping they'll pan out as key components of … more

New Wave: Spin Soliton Could Be a Hit in Cell Phone Communication
Release Date: 09/14/2010

Researchers at the National Institute of Standards and Technology (NIST) have found theoretical evidence* of a new way to generate the … more

Is Your Microrobot Up for the (NIST) Challenge?
Release Date: 10/20/2009

The scientists and engineers who introduced the world to tiny robots demonstrating soccer skills are creating the next level of friendly … more

Nanosoccer Robots Ready to Compete in Upcoming RoboCup Games
Release Date: 06/16/2009

T he National Institute of Standards and Technology (NIST) will be serving up "soccer under glass" - the glass of a microscope lens - when … more

NIST ‘Stress Tests’ Probe Nanoscale Strains in Materials
Release Date: 11/25/2008

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of … more

Bottoms Up: Better Organic Semiconductors for Printable Electronics
Release Date: 09/03/2008

Researchers from the National Institute of Standards and Technology (NIST) and Seoul National University (SNU) have learned how to tweak a new … more

‘Electron Trapping’ May Impact Future Microelectronics Measurements
Release Date: 06/24/2008

Using an ultra-fast method of measuring how a transistor switches from the “off” to the “on” state, researchers at the National Institute of … more

Exposing the Sensitivity of Extreme Ultraviolet Photoresists
Release Date: 06/24/2008

Researchers at the National Institute of Standards and Technology (NIST) have confirmed that the photoresists used in next-generation … more

Making a Good Impression: Nanoimprint Lithography Tests at NIST
Release Date: 04/29/2008

In what should be good news for integrated circuit manufacturers, recent studies by the National Institute of Standards and Technology (NIST) have … more

NIST Team Proves Bridge from Conventional to Molecular Electronics Possible
Release Date: 03/18/2008

Researchers at the National Institute of Standards and Technology (NIST) have set the stage for building the “evolutionary link” between the … more

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