NIST logo
NIST Home > Materials Science Semiconductor Materials Portal 

Materials Science Semiconductor Materials Portal

Programs and Projects
COMPLETED: Polymers for Next-Generation Lithography

Our goal is to develop measurement methods with sufficiently high spatial resolution to uncover the materials limitations in the resolution of … more

Analytical Transmission Scanning Electron Microscopy

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Strain Mapping and Simulation

We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal … more

Strain fields and phase distribution maps of indented Si

In Raman-spectroscopy enhanced IIT, an indentation device that is coupled with a Raman microscope to conduct in situ spectroscopic and optical … more

Defect Structures and Electronic Properties of Graphene

Graphene and related materials have remarkable physical properties, such as high carrier mobilities. These properties provide many opportunities … more

Measuring Topological Insulator Surface State Properties

The transmission of information in today’s electronics requires the movement of electrical charge, which expends energy and generates heat, … more



General Information:
301-975-NIST (6478)

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070