NIST logo
NIST Home > Materials Science Semiconductor Materials Portal 

Materials Science Semiconductor Materials Portal

Programs and Projects
Defect Structures and Electronic Properties of Graphene

Graphene and related materials have remarkable physical properties, such as high carrier mobilities. These properties provide many opportunities … more

COMPLETED: Polymers for Next-Generation Lithography

Our goal is to develop measurement methods with sufficiently high spatial resolution to uncover the materials limitations in the resolution of … more

Analytical Transmission Scanning Electron Microscopy

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Strain Mapping and Simulation

We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal … more

Strain fields and phase distribution maps of indented Si

In Raman-spectroscopy enhanced IIT, an indentation device that is coupled with a Raman microscope to conduct in situ spectroscopic and optical … more

Measuring Topological Insulator Surface State Properties

The transmission of information in today’s electronics requires the movement of electrical charge, which expends energy and generates heat, … more

*
Bookmark and Share

Contact

General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070