Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

MMIC Package Characterization with Active Loads

Published

Author(s)

K. R. Phillips, Dylan Williams

Abstract

Abstract: A technique for characterizing microwave packages based on active PIN diode standards is discussed. The technique allows packages to be accurately characterized from external reflection coefficient measurements when a single bias-dependent active standard is embedded within it. The frequency characteristics, stability, and linearity of active PIN diode standards are investigated.
Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
18
Conference Dates
November 29-30, 1990
Conference Location
Monterey, CA

Citation

Phillips, K. and Williams, D. (1990), MMIC Package Characterization with Active Loads, Tech Dig., Auto. RF Tech. Group Conf., Monterey, CA, [online], https://doi.org/10.1109/ARFTG.1990.323997, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=9318 (Accessed October 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created October 31, 1990, Updated October 12, 2021
Was this page helpful?