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PUBLICATIONS

A New Refractometer by Combining a Variable Length Vacuum Cell and a Double-Pass Michelson Interferometer

Published

Author(s)

K Fujii, Edwin R. Williams, Richard L. Steiner
Proceedings Title
Tech. Dig., Conf. on Precision Electromagnetic Measurements
Conference Dates
June 17-20, 1999
Conference Location
Braunschweig, 1, GM
Pub Type
Conferences

Download Paper

Local Download
Electrical / electromagnetic metrology

Citation

Fujii, K. , Williams, E. and Steiner, R. (1996), A New Refractometer by Combining a Variable Length Vacuum Cell and a Double-Pass Michelson Interferometer, Tech. Dig., Conf. on Precision Electromagnetic Measurements, Braunschweig, 1, GM, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=9148 (Accessed April 26, 2024)

Created May 31, 1996, Updated October 12, 2021