Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Dean G. Jarrett; Marlin E. Kraft;|
|Title:||10 TOhm and 100 TOhm High Resistance Measurements at NIST|
|Published:||September 25, 2013|
|Abstract:||The measurement techniques, standards, and bridges used to calibrate standard resistors in the 10 TΩ to 100TΩ range at NIST are described. Standard resistors, guarded Hamon transfer standard, and 10:1 and 100:1 bridge ratios, were used to provide multiple paths from 1 TΩ to the higher levels of resistance. Settling times, voltage coefficients, drift rates, and temperature coefficients of the resistance standards were determine to evaluate the extension of high resistance measurements at NIST beyond the 1 TΩ level of resistance.|
|Proceedings:||10th International Seminar on Electrical Metrology (X Semetro)|
|Location:||Buenos Aires, -1|
|Dates:||September 25-27, 2013|
|Keywords:||standard resistor, guarded Hamon transfer standard, settling time, scaling, measurements|
|Research Areas:||Electronics & Telecommunications, Electrical Quantities|
|PDF version:||Click here to retrieve PDF version of paper (547KB)|