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NIST Authors in Bold
|Author(s):||Jeffrey A. Jargon; Dylan F. Williams; Paul D. Hale; Michael D. Janezic;|
|Title:||Characterizing a Noninsertable Directional Device Using the NIST Uncertainty Framework|
|Published:||June 06, 2014|
|Abstract:||We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of a chain of components, including a coaxial-to-waveguide adapter, a waveguide band-pass filter, a waveguide low-noise amplifier, a waveguide isolator, and a waveguide taper. With the aforementioned directional components, the well-known adapter removal technique is not adequate for characterizing our device. In this paper, we describe and implement our method, and propagate the uncertainties from the two required calibrations to the characterized device.|
|Proceedings:||ARFTG 83rd Microwave Measurement Conference|
|Location:||Tampa Bay, FL|
|Dates:||June 6, 2014|
|Keywords:||Characterize, coaxial, directional, noninsertable, rectangular waveguide, uncertainty, vector network analyzer|
|Research Areas:||Optoelectronics, Measurement Needs|