| Author(s): |
Michael T. Postek; Joseph J. Kopanski; David A. Wollman; |
| Title: |
New Research in Nanotechnology - Nanotechnology Science and Technology Series |
| Published: |
February 19, 2011 |
| Abstract: |
NIST is developing a broad range of nanometrology (measurements) and nanomanufacturing techniques necessary for the successful commercialization of nanotechnology. This book is a compilation of a number of selected NIST accomplishments in nanotechnology. These accomplishments are categorized into the NNI’s Program Component Areas (PCAs), which are described in the text. The NNI has established the PCAs as the major subject areas for research and development vital to the successful commercialization of Nanotechnology and NIST is developing the needed nanometrology. |
| Citation: |
New Research in Nanotechnology - Nanotechnology Science and Technology Series |
| Publisher: |
Nova Science Publishers, Inc., Hauppauge, NY |
| Keywords: |
Nanotechnology, Nanometrology, nanomanufacturing, metrology, measurement, PCA, program component areas |
| Research Areas: |
Nanotechnology |
