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NIST Authors in Bold
|Author(s):||David R. Kuhn; Raghu N. Kacker; Yu Lei;|
|Title:||Combinatorial Coverage Measurement|
|Published:||October 26, 2012|
|Abstract:||Combinatorial testing applies factor covering arrays to test all t-way combinations of input or configuration state space. In some testing situations, it is not practical to use covering arrays, but any set of tests covers at least some portion of t-way combinations up to t [less than or equal to] n. This report describes measures of combinatorial coverage that can be used in evaluating the degree of t-way coverage of any test suite, regardless of whether it was initially constructed for combinatorial coverage.|
|Citation:||NIST Interagency/Internal Report (NISTIR) - 7878|
|Keywords:||combinatorial testing, component interaction failure, component interaction failure, factor covering array, state-space coverage, factor covering array, state-space coverage, factor covering array, state-space coverage|
|Research Areas:||Conformance Testing, Computer Security|
|PDF version:||Click here to retrieve PDF version of paper (437KB)|