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|Author(s):||Jason A. DeSalvo; Archita Hati; Craig W. Nelson; David A. Howe;|
|Title:||Phase-Noise Measurement of a 670 GHz Source|
|Published:||May 24, 2012|
|Abstract:||We present phase-noise measurements in support of terahertz electronics. Using digital phase-noise measurement techniques and an even-harmonic mixer, we achieve a phase-noise measurement system in waveguide (WR1.5). At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.|
|Conference:||2012 IEEE International Frequency Control Symposium|
|Proceedings:||Proceedings of the 2012 IEEE International Frequency Control Symposium|
|Pages:||pp. 1 - 4|
|Dates:||May 22-24, 2012|
|Keywords:||frequency control,harmonic mixers,metrology,phase noise,ubmillimeter wave measurements|