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|Author(s):||Heayoung Yoon; Dmitry A. Ruzmetov; Paul M. Haney; Marina S. Leite; Behrang H. Hamadani; Albert A. Talin; Nikolai B. Zhitenev;|
|Title:||High-Resolution Local Current Measurement of CdTe Solar Cells|
|Published:||October 04, 2012|
|Abstract:||We investigate local electronic properties of CdTe solar cells using electron beam to excite electron-hole pairs and evaluate spatially resolved photocurrent characteristics. Standard semiconductor processes were used to fabricate Ohmic metal contacts on the surface of p-type CdTe / n-type CdS device extracted from a commercial solar panel. An ion milling process was used to prepare cross-sections of the devices. Local injection of carriers was controlled by an acceleration voltage of electron beam (1 kV ‹ 30 kV) in a scanning electron microscope (SEM), and the results were correlated with the local morphology and microstructure.|
|Conference:||38th IEEE Photovoltaic Specialists Conference|
|Pages:||pp. 003217 - 003219|
|Dates:||June 4-8, 2012|
|Keywords:||solar cells, thin film, CdTe, grain boundary, electron beam induced current, EBIC, cross section, focused ion beam|
|Research Areas:||Electron microscopy (EM, TEM, SEM, STEM), Solar|
|DOI:||http://dx.doi.org/10.1109/PVSC.2012.6318262 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (872KB)|