NIST logo

Publication Citation: High-Resolution Local Current Measurement of CdTe Solar Cells

NIST Authors in Bold

Author(s): Heayoung Yoon; Dmitry A. Ruzmetov; Paul M. Haney; Marina S. Leite; Behrang H. Hamadani; Albert A. Talin; Nikolai B. Zhitenev;
Title: High-Resolution Local Current Measurement of CdTe Solar Cells
Published: October 04, 2012
Abstract: We investigate local electronic properties of CdTe solar cells using electron beam to excite electron-hole pairs and evaluate spatially resolved photocurrent characteristics. Standard semiconductor processes were used to fabricate Ohmic metal contacts on the surface of p-type CdTe / n-type CdS device extracted from a commercial solar panel. An ion milling process was used to prepare cross-sections of the devices. Local injection of carriers was controlled by an acceleration voltage of electron beam (1 kV ‹ 30 kV) in a scanning electron microscope (SEM), and the results were correlated with the local morphology and microstructure.
Conference: 38th IEEE Photovoltaic Specialists Conference
Pages: pp. 003217 - 003219
Location: Austin, TX
Dates: June 4-8, 2012
Keywords: solar cells; thin film; CdTe; grain boundary; electron beam induced current; EBIC; cross section; focused ion beam
Research Areas: Electron microscopy (EM, TEM, SEM, STEM), Solar
DOI: http://dx.doi.org/10.1109/PVSC.2012.6318262  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (872KB)