NIST Authors in Bold
| Author(s): | Heayoung Yoon; Dmitry A. Ruzmetov; Paul M. Haney; Marina S. Leite; Behrang H. Hamadani; Albert A. Talin; Nikolai B. Zhitenev; |
|---|---|
| Title: | High-Resolution Local Current Measurement of CdTe Solar Cells |
| Published: | October 04, 2012 |
| Abstract: | We investigate local electronic properties of CdTe solar cells using electron beam to excite electron-hole pairs and evaluate spatially resolved photocurrent characteristics. Standard semiconductor processes were used to fabricate Ohmic metal contacts on the surface of p-type CdTe / n-type CdS device extracted from a commercial solar panel. An ion milling process was used to prepare cross-sections of the devices. Local injection of carriers was controlled by an acceleration voltage of electron beam (1 kV – 30 kV) in a scanning electron microscope (SEM), and the results were correlated with the local morphology and microstructure. |
| Conference: | 38th IEEE Photovoltaic Specialists Conference |
| Pages: | pp. 003217 - 003219 |
| Location: | Austin, TX |
| Dates: | June 4-8, 2012 |
| Keywords: | solar cells; thin film; CdTe; grain boundary; electron beam induced current; EBIC; cross section; focused ion beam |
| Research Areas: | Electron microscopy (EM, TEM, SEM, STEM), Solar |
| DOI: | 10.1109/PVSC.2012.6318262 (Note: May link to a non-U.S. Government webpage) |
| PDF version: | Click here to retrieve PDF version of paper (852KB) |