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|Author(s):||Jeremy A. Marvel; Roger D. Eastman; Geraldine S. Cheok; Kamel S. Saidi; Tsai Hong Hong; Elena R. Messina;|
|Title:||Technology Readiness Levels for Randomized Bin Picking|
|Published:||June 13, 2012|
|Abstract:||A proposal for the utilization of Technology Readiness Levels to the application of unstructured bin picking is discussed. A special session was held during the 2012 Performance Metrics for Intelligent Systems workshop to discuss the challenges and opportunities associated with the bin picking problem, and to identify the potentials for applying an industry-wide standardized assessment and reporting framework such as Technology Readiness Levels to bin picking. Representative experts from government, academia, and industry were assembled to form a special panel to share their insights into the challenge.|
|Proceedings:||2012 Performance Metrics for Intelligent Systems Workshop|
|Pages:||pp. 109 - 113|
|Location:||College Park, MD|
|Dates:||March 20-22, 2012|
|Keywords:||Bin Picking, Technology Readiness, 6DOF Metrology|
|Research Areas:||Perception, Metrology, Manufacturing|
|PDF version:||Click here to retrieve PDF version of paper (371KB)|