Publication Citation
NIST Authors in Bold
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| Author(s): | Jason T. Ryan; Richard G. Southwick; Jason P. Campbell; Kin P. Cheung; Chadwin Young; |
|---|---|
| Title: | Spectroscopic Charge Pumping in the Presence of High Densities of Bulk Dielectric Traps |
| Published: | May 31, 2012 |
| Abstract: | |
| Conference: | International reliability Physics Symposium |
| Proceedings: | Proceedings of the International reliability Physics Symposium |
| Pages: | pp. XT1.1 - XT1.4 |
| Location: | Anaheim, CA |
| Dates: | April 15-19, 2012 |
| Research Areas: | Characterization |