Publication Citation
NIST Authors in Bold
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| Author(s): | Jason T. Ryan; Richard G. Southwick; Jason P. Campbell; Kin P. Cheung; Chadwin Young; |
|---|---|
| Title: | On the “U-Shaped” Continuum of Band Edge States at the Si/SiO2 Interface |
| Published: | December 01, 2011 |
| Abstract: | |
| Citation: | Applied Physics Letters |
| Volume: | 99 |
| Pages: | 3 pp. |
| Research Areas: | Characterization |