NIST logo

Publication Citation: On the ,U-ShapedŠ Continuum of Band Edge States at the Si/SiO2 Interface

NIST Authors in Bold

Author(s): Jason T. Ryan; Richard G. Southwick; Jason P. Campbell; Kin P. Cheung; Chadwin Young;
Title: On the ,U-ShapedŠ Continuum of Band Edge States at the Si/SiO2 Interface
Published: December 01, 2011
Abstract:
Citation: Applied Physics Letters
Volume: 99
Pages: 3 pp.
Research Areas: Characterization