Publication Citation
NIST Authors in Bold
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| Author(s): | Jason T. Ryan; Lan Wei; Jason P. Campbell; Richard G. Southwick; Kin P. Cheung; Tony Oates; Phillip Wong; John S. Suehle; |
|---|---|
| Title: | When Does a Circuit Really Fail? |
| Published: | December 15, 2011 |
| Abstract: | |
| Conference: | International Integrated Reliability Workshop |
| Proceedings: | International Integrated Reliability Workshop Final Report |
| Pages: | pp. 33 - 36 |
| Location: | South Lake Tahoe, CA |
| Dates: | October 16-21, 2011 |
| Research Areas: | Analysis Tools and Techniques |