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Publication Citation: When Does a Circuit Really Fail?

NIST Authors in Bold

Author(s): Jason T. Ryan; Lan Wei; Jason P. Campbell; Richard G. Southwick; Kin P. Cheung; Tony Oates; Phillip Wong; John S. Suehle;
Title: When Does a Circuit Really Fail?
Published: December 15, 2011
Conference: International Integrated Reliability Workshop
Proceedings: International Integrated Reliability Workshop Final Report
Pages: pp. 33 - 36
Location: South Lake Tahoe, CA
Dates: October 16-21, 2011
Research Areas: Analysis Tools and Techniques