| Author(s): |
Pragya R. Shrestha; Adaku Ochia; Kin P. Cheung; Jason P. Campbell; Helmut Baumgart; Gary Harris; |
| Title: |
High Speed Endurance and Switching Measurements for Memristive Switches |
| Published: |
March 06, 2012 |
| Abstract: |
Accurate capture of the Set/Reset characteristics is a necessary but challenging task for the development of memristive switches. Here we describe and demonstrate a technique capable of meeting this challenge. This technique can measure the transient current during the Set/Reset operation with a rise time of 4 ns and simultaneously measure the OFF state resistance (Roff) to 1.6 GΩ and the ON state resistance (Ron) to less than 10 . It can also rapidly cycle through the sense states to study endurance. Solid electrolyte Pt/Ta2O5/Cu memristive switches (Ron/Roff ratio of >104) are used to highlight this new measurement capability. |
| Citation: |
Electrochemical and Solid State Letters |
| Volume: |
15 |
| Issue: |
5 |
| Pages: |
pp. H173 - H175 |
| Research Areas: |
Analysis Tools and Techniques, Characterization |
| DOI: |
10.1149/2.002206esl (Note: May link to a non-U.S. Government webpage) |
