Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Sylvere I. Krima; Allison Barnard Feeney; Sebti Foufou;|
|Title:||Dynamic customization and validation of product data models using the semantic web tools|
|Published:||July 12, 2012|
|Abstract:||Product Lifecycle Management (PLM) has always required robust solutions for representing product data models. Product data models enable in-formation exchange across different organizations, actors, processes and stages in the product lifecycle. In this context, standardization of models plays a key role, since it ensures interoperability between the different systems that support information exchange. These standard models need to support diverse domain-specific requirements from the multitude of disciplines involved during a product lifecycle. Due to this diversity, challenges are to (1) develop multidisciplinary models, (2) extend them to support new requirements over time (new products, new regulations, new materials, new processes,) and (3) implement the resulting gigantic information models. ISO 10303, the reference standard for PLM-related data models provides a mechanism that enables specialization of generic product data to address some of these issues. In this paper we introduce the need for dynamic PLM-related information models, detail the existing ISO 10303 mechanism and identify its limitations. We then present a methodology for enhancing that mechanism using OWL ontologies for representing product data models and SPIN, a new semantic web technology, for validating product data and overcoming OWL limitations.|
|Conference:||The IFIP WG5.1 9th International Conference on Product Lifecycle Management|
|Proceedings:||9th International Conference on Product Lifecycle Management|
|Dates:||July 9-11, 2012|
|Keywords:||product lifecycle management, information modeling, long-term data retention, semantic web, OWL, STEP|
|Research Areas:||Product Data, Ontologies, Documentary Standards, Manufacturing|
|PDF version:||Click here to retrieve PDF version of paper (2MB)|