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Publication Citation: Quality Information Framework ‹ Integrating Metrology Processes

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Author(s): Fiona Zhao; Thomas R. Kramer; John A. Horst; William G. Rippey; Robert Brown;
Title: Quality Information Framework ‹ Integrating Metrology Processes
Published: May 25, 2012
Abstract: As defined by major dimensional metrology system users and suppliers, the Quality Information Framework (QIF) is an integrated and holistic set of information models which, if widely adopted, can enable the effective exchange of metrology data throughout the entire manufacturing quality measurement process - from design to planning to execution to analysis. This paper introduces the philosophy and rationale behind QIF, as well as some of its detailed content. QIF is a set of XML data models, which if broadly and correctly implemented in vendor software, will allow quality software and hardware to exchange data freely and effectively. Past standard efforts in manufacturing quality systems have had a variety of shortcomings, which QIF plans to overcome. The data models developed during the first year of QIF project include the QIF XML schema library and the Quality Measurement Results (QMResults) schema. A new modeling method, used to model quality characteristics and measurement features, is able to cover different use cases such as reverse engineering, batch quality measurement, and discrete quality measurement. Correct semantic associations between measurement feature and quality characteristics, and between nominal values and actual values are guaranteed by implementing strong typing using identifiers. The next step of QIF project is to conduct a set of pilot tests to serve as validation and demonstration of the information models.
Proceedings: 14th IFAC Symposium on Information Control Problems in Manufacturing (INCOM)
Pages: 8 pp.
Location: Bucharest, -1
Dates: May 23-25, 2012
Keywords: Quality Information Framework (QIF), manufacturing quality, interoperability, data model, XML schema, measurement features, quality characteristics
Research Areas: Dimensional Metrology
PDF version: PDF Document Click here to retrieve PDF version of paper (834KB)