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NIST Authors in Bold
|Author(s):||James Schaffner; Dylan F. Williams;|
|Title:||On-Chip Security Using Electromagnetic Analysis|
|Published:||October 27, 2011|
|Abstract:||In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic monitoring than from power analysis. This is a first step to developing systematic ways of assessing the vulnerabilities of security microcontrollers to these attacks and developing and assessing the effectiveness of mitigation strategies for these attacks.|
|Citation:||NISTGCR - 687-12-71|
|Keywords:||RFID,seturity,electro-magnetic analysis,integrated circuit|