NIST Authors in Bold
| Author(s): | Tian T. Shen; Wei Wu; Qingkai Yu; Curt A. Richter; Randolph E. Elmquist; David B. Newell; Yong P. Chen; |
|---|---|
| Title: | Quantum Hall effect on centimeter scale chemical vapor deposited graphene films |
| Published: | December 07, 2011 |
| Abstract: | We report observations of well developed half integer quantum Hall effect on mono layer graphene films of 7 mm × 7 mm in size. The graphene films are grown by chemical vapor deposition on copper, then transferred to SiO2/Si substrates, with typical carrier mobilities ≈4000 cm2/Vs. The large size graphene with excellent quality and electronic homogeneity demonstrated in this work is promising for graphene-based quantum Hall resistance standards and can also facilitate a wide range of experiments on quantum Hall physics of graphene and practical applications exploiting the exceptional properties of graphene. |
| Citation: | Applied Physics Letters |
| Keywords: | graphene;CVD;QHE |
| Research Areas: | Condensed Matter Physics |