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NIST Authors in Bold
|Author(s):||Adam A. Creuziger; Mark D. Vaudin;|
|Title:||Report on VAMAS Round Robin of ISO 13067: Microbeam Analysis,Electron Backscatter Diffraction,Measurement of Average Grain Size|
|Published:||September 14, 2011|
|Abstract:||The authors recently participated in a round robin evaluation of a new ISO document draft, ISO 13067: Microbeam analysis ‹ Electron backscatter diffraction ‹ Measurement of average grain size. This report details the results of the study, some of the difficulties encountered and suggestions to improve the ISO document. The average grain size measured using this technique was reasonable as compared internally within this study and compared well to the aggregate round robin data revealed to us. The methods described in ISO 13067 to modify or ,clean up‰ the raw data were found to significantly affect the average grain size value.|
|Citation:||NIST Interagency/Internal Report (NISTIR) - 7814|
|Research Areas:||Materials performance|