Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Jason P. Killgore; Donna C. Hurley; Dalia Yablon; Joseph Turner; Philip Yuya; Roger Proksch; Anil Gannepalli; Andy Tsou;|
|Title:||Viscoelastic Property Mapping with Contact Resonance Force Microscopy|
|Published:||November 04, 2011|
|Abstract:||We demonstrate accurate nanoscale mapping of loss and storage modulus on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). The viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: pixel-by-pixel point mapping and continuous scanning. With point mapping and low-velocity scanning, the relative loss and storage modulus values are in good agreement with time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM.|
|Keywords:||Atomic Force Microscopy, AFM, Contact Resonance Force Microscopy, Viscoelasticity|
|Research Areas:||Polymers, Atomic force microscopy (AFM)|
|PDF version:||Click here to retrieve PDF version of paper (2MB)|