| Author(s): |
Jason P. Killgore; Donna C. Hurley; Dalia Yablon; Joseph Turner; Philip Yuya; Roger Proksch; Anil Gannepalli; Andy Tsou; |
| Title: |
Viscoelastic Property Mapping with Contact Resonance Force Microscopy |
| Published: |
November 04, 2011 |
| Abstract: |
We demonstrate accurate nanoscale mapping of loss and storage modulus on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). The viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: pixel-by-pixel point mapping and continuous scanning. With point mapping and low-velocity scanning, the relative loss and storage modulus values are in good agreement with time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM. |
| Citation: |
Langmuir |
| Pages: |
5 pp. |
| Keywords: |
Atomic Force Microscopy; AFM; Contact Resonance Force Microscopy; Viscoelasticity |
| Research Areas: |
Polymers, Atomic force microscopy (AFM) |
| PDF version: |
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