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Publication Citation: Viscoelastic Property Mapping with Contact Resonance Force Microscopy

NIST Authors in Bold

Author(s): Jason P. Killgore; Donna C. Hurley; Dalia Yablon; Joseph Turner; Philip Yuya; Roger Proksch; Anil Gannepalli; Andy Tsou;
Title: Viscoelastic Property Mapping with Contact Resonance Force Microscopy
Published: November 04, 2011
Abstract: We demonstrate accurate nanoscale mapping of loss and storage modulus on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). The viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: pixel-by-pixel point mapping and continuous scanning. With point mapping and low-velocity scanning, the relative loss and storage modulus values are in good agreement with time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM.
Citation: Langmuir
Pages: 5 pp.
Keywords: Atomic Force Microscopy, AFM, Contact Resonance Force Microscopy, Viscoelasticity
Research Areas: Polymers, Atomic force microscopy (AFM)
PDF version: PDF Document Click here to retrieve PDF version of paper (2MB)