| Author(s): |
Joseph A. Stroscio; H.J. Yang; Jungseok Chae; H. Baek; Jeonghoon Ha; Young Kuk; Suyong S. Jung; Young J. Song; Nikolai B. Zhitenev; S.J. Woo; Young-Woo Son; |
| Title: |
Charge Puddles and Edge Effect in a Graphene Device as Studied by a Scanning Gate Microscope |
| Published: |
March 01, 2011 |
| Abstract: |
|
| Citation: |
International Journal of High Speed Electronics and Systems |
| Volume: |
20 |
| Issue: |
01 |
| Pages: |
pp. 205 - 216 |
| Research Areas: |
Characterization, Nanometrology, and Nanoscale Measurements |
| PDF version: |
 Click here to retrieve PDF version of paper (793KB) |
