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Publication Citation: Charge Puddles and Edge Effect in a Graphene Device as Studied by a Scanning Gate Microscope

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Author(s): Joseph A. Stroscio; H.J. Yang; Jungseok Chae; H. Baek; Jeonghoon Ha; Young Kuk; Suyong S. Jung; Young J. Song; Nikolai B. Zhitenev; S.J. Woo; Young-Woo Son;
Title: Charge Puddles and Edge Effect in a Graphene Device as Studied by a Scanning Gate Microscope
Published: March 01, 2011
Abstract:
Citation: International Journal of High Speed Electronics and Systems
Volume: 20
Issue: 01
Pages: pp. 205 - 216
Research Areas: Characterization, Nanometrology, and Nanoscale Measurements
PDF version: PDF Document Click here to retrieve PDF version of paper (812KB)