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NIST Authors in Bold
|Author(s):||Joseph A. Stroscio; H.J. Yang; Jungseok Chae; H. Baek; Jeonghoon Ha; Young Kuk; Suyong S. Jung; Young J. Song; Nikolai B. Zhitenev; S.J. Woo; Young-Woo Son;|
|Title:||Charge Puddles and Edge Effect in a Graphene Device as Studied by a Scanning Gate Microscope|
|Published:||March 01, 2011|
|Citation:||International Journal of High Speed Electronics and Systems|
|Pages:||pp. 205 - 216|
|Research Areas:||Characterization, Nanometrology, and Nanoscale Measurements|
|PDF version:||Click here to retrieve PDF version of paper (812KB)|