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|Author(s):||Sukumar Rajauria; L. Pascal; P. Gandit; F. Hekking; B. Pannetier; H. Courtois;|
|Title:||Efficiency of quasiparticle evacuation in superconducting devices|
|Published:||January 23, 2012|
|Abstract:||We have studied the di®usion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes signi¯cantly to the evacuation of excess quasiparticles.|
|Citation:||Physical Review B|
|PDF version:||Click here to retrieve PDF version of paper (328KB)|