NIST logo

Publication Citation: Efficiency of quasiparticle evacuation in superconducting devices

NIST Authors in Bold

Author(s): Sukumar Rajauria; L. Pascal; P. Gandit; F. Hekking; B. Pannetier; H. Courtois;
Title: Efficiency of quasiparticle evacuation in superconducting devices
Published: January 23, 2012
Abstract: We have studied the di®usion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes signi¯cantly to the evacuation of excess quasiparticles.
Citation: Physical Review B
Volume: 85
Issue: 2
Research Areas: Physics
PDF version: PDF Document Click here to retrieve PDF version of paper (328KB)