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Publication Citation: A new interface defect spectroscopy method

NIST Authors in Bold

Author(s): Jason T. Ryan; Liangchun (. Yu; Jae Han; Joseph J. Kopanski; Kin P. Cheung; Fei Zhang; Chen Wang; Jason P. Campbell; John S. Suehle; Vinny Tilak; Jody Fronheiser;
Title: A new interface defect spectroscopy method
Published: April 26, 2011
Abstract:
Pages: 30 pp.
Research Areas: Characterization