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NIST Authors in Bold
|Author(s):||Konrad Rykaczewski; John H. Scott;|
|Title:||Methodology for imaging of nano-to-microscale water condensation dynamics on complex nanostructures|
|Published:||June 11, 2011|
|Abstract:||By transferring of a small part of a macroscale sample to a novel thermally insulated sample platform we are able to mitigate flooding and electron heating problems typically associated with Environmental Scanning Electron Microscopy imaging of water condensation. We image condensation dynamics on individual complex particles and a superhydrophobic network of nanostructures with an unobstructed 90° perspective of the surface and water interface with viewing field as small as 1 µm2.|
|Pages:||pp. 5962 - 5968|
|Keywords:||nanoscale condensation, wet-STEM, ESEM, superhydrophobic surfaces|
|Research Areas:||Focused ion beam milling (FIB), Electron microscopy (EM, TEM, SEM, STEM), Nanobiotechnology, Nanofabrication, Nanomanufacturing, and Nanoprocessing, Manufacturing, Nanotechnology, Metrology, Characterization, Nanometrology, and Nanoscale Measurements, Humidity|