NIST Authors in Bold
| Author(s): | William G. Rippey; |
|---|---|
| Title: | DMSC Rallies at IMTS 2010, and frequently asked questions |
| Published: | March 21, 2011 |
| Abstract: | The Dimensional Metrology Standards Consortium (DMSC) marketing roadshow converged on the International Manufacturing Technology Show (IMTS) 2010 in Chicago this past September. Buoyed by many supporters, the organization showed the importance of dimensional quality standards efforts and the commitment of its members and board of directors to reach out to market, educate, even to cheerlead for quality data standards. The second section of the article lists frequently asked questions about DMSC's new standards effort, the Quality Information Framework. |
| Citation: | Dimensional Metrology Standards Consortium |
| Website: | www.dmisstandard.org |
| Pages: | 1 pp. |
| Keywords: | dimensional metrology; standards; quality information framework |
| Research Areas: | Metrology and Standards for Manufacturing Systems and Data, Dimensional Metrology, Metrology and Standards for Manufacturing Processes |
| PDF version: | Click here to retrieve PDF version of paper (498KB) |