NIST Authors in Bold
| Author(s): | Cynthia H. Reed; Daniel V. Samarov; Dennis D. Leber; Zhe Liu; John Little; |
|---|---|
| Title: | Assessing the shelf-life of a prototype reference material for product emissions testing |
| Published: | May 02, 2011 |
| Abstract: | The National Institute of Standards and Technology (NIST) and Virginia Tech (VT) are developing a volatile organic compound (VOC) reference material to validate product emissions chamber testing. To verify the storage method of the material and determine its potential shelf-life, a series of tests was completed to measure the film’s emission rates after storage times of up to 6 months. The emission rate of toluene was measured from each film in a 50 L stainless steel chamber after storage times of 1 day, 13 days, 23 days, 41 days, 62 days, 104 days, 139 days, and 181 days. Although an inverse relationship between material sample age and toluene emission rate was observed at 2 h and 24 h, the difference in the amount of toluene emitted from each of the different aged samples becomes less evident and eventually statistically indistinguishable at 48 h and beyond. |
| Conference: | Indoor Air 2011- International Society of Indoor Air Quality and Climate |
| Proceedings: | The 12th International Conference on Indoor Air Quality and Climate |
| Location: | Austin, TX |
| Dates: | June 5-10, 2011 |
| Keywords: | Volatile organic compounds, test method validation, product certification |
| Research Areas: | Indoor Air Quality, Building and Fire Research |
| PDF version: | Click here to retrieve PDF version of paper (82KB) |